We provide latch-up testing services to evaluate the resistance of CMOS ICs and semiconductor products containing them to latch-up destruction.
■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as JEDEC, JEITA, and AEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and root cause investigation to resolve the problem.
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basic information
■ Current pulse application method (JEDEC, JEITA, AEC) ■ Power supply overvoltage method (JEDEC, JEITA, AEC) ■ Voltage pulse application method (AEC) ■ ESD pulse application method (reference test) ■ Latch-up judgment method (JEDEC method, current definition method) ■ Also supports measurement of protection diode characteristics before and after testing. ■ Also supports arrangement of sockets, dedicated boards, and fabrication of test boards. * Number of VCC power supplies: 4 units (100V/0.5A: 1 unit, 50V/1A: 3 units) Capable of supporting multi-power supply devices * Maximum voltage for power supply overvoltage method: 150V (VCC voltage + VT pulse voltage ⇒ maximum 150V)
Price information
We will provide a quotation based on the examination conditions.
Delivery Time
※It will vary depending on the test conditions and quantity.
Applications/Examples of results
JEDEC JEITA AEC Various standard tests
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.