Achieving overwhelming resolution! Measuring previously hidden minute phenomena.
The "Handy AFM" is an atomic force microscope that can be used as a substitute for SEM and high-magnification 3D optical microscopes. It is ultra-compact, measuring 15 cm in both depth and width. The scanning head can be selected from two types: high-resolution and wide-area, and can be exchanged instantly. 【Features】 ■ Probe exchange can be performed in a few seconds ■ Carbon nanotube probes can also be auto-approached ■ Optional support for a compact automatic stage and inline fully automatic machines *For more details, please download the PDF or feel free to contact us.
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basic information
【Measurement Inspection Examples】 ■Solar Cells ■Silicon Carbide Thin Films ■Quantum Dots ■Silicon Wafers ■Probe Marks ■IC Patterns *For more details, please download the PDF or feel free to contact us.
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At Softworks Co., Ltd., we are engaged in the development and sales of computer software. Theme = In response to conditions, we propose a solution = development of image processing software. We start with considerations of optical systems such as lighting and mechanical systems, and handle everything from interfacing with mechanical systems to the development of specific image processing software with technical consultants.
![[Analysis Case] Dynamic Viscoelastic Evaluation of PDMS using AFM](https://image.mono.ipros.com/public/product/image/387108/IPROS889105444681577233.png?w=280&h=280)
![[Analysis Case] Evaluation of Mechanical Properties of Hair Cross-Sections Prepared by Microtome Method](https://image.mono.ipros.com/public/default/object/noimage_l.gif?w=280&h=280)
