Automatic visual inspection device

Automatically map defects (scratches, foreign objects) at the submicron level.

The automatic visual inspection device that we handle is a device for inspecting defects in various materials such as film and glass. It can detect a variety of defects including scratches, foreign objects, and pinholes. The detected defects are mapped, and by simply clicking on their positions with a mouse, you can observe microscope images. It also supports the inspection of roll film ends that were previously done visually. 【Features】 ■ Performs automatic mapping to obtain positional information of scratches and foreign objects at the sub-micron level ■ Conducts detailed inspections of each scratch and foreign object based on the positional information from the mapping data ■ Enables a variety of inspections including transmission/reflection, bright/dark field, polarization, and differential interference observation ■ Has a significant track record of inspecting defects that were previously difficult to assess ■ Visualizes defects and unevenness that were challenging to detect through visual inspection, enabling simplified inspections (Unevenness Viewer) *For more details, please download the PDF or feel free to contact us.

Visual Inspection Equipment