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Our company handles an L load testing device that applies high voltage and high current to samples in the safe operating area (ASO) to check whether they are destroyed or not. An inductor (L) is connected to the drain as the load for the sample (DUT), and the input gate voltage is controlled to switch the DUT. The switching of the DUT generates a reverse voltage across the L load, and the voltage and current at this time are used to conduct a durability test on the DUT. 【Product Lineup】 ■FET-901 ■FET-902 ■FET-9205 ■EF-5002 *For more details, please feel free to contact us.
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【Measurement Specifications】 ■ Set Voltage Range ・VDS Power Supply: 0.0V to 50.0V ・VG1 Power Supply: 0.0V to +30.0V ・VG2 Power Supply: 0.0V to -30.0V ■ Set Resolution ・VDS Power Supply: 1.0V ・VG1 Power Supply: 0.1V ・VG2 Power Supply: 0.1V ■ Output Current ・VDS Power Supply: 40A or more ・VG1 Power Supply: +100mA or more ・VG2 Power Supply: -100mA or more ■ Setting Accuracy ・VDS Power Supply: ±(1%+0.5A) ・VG1 Power Supply: ±(1%+0.1A) ・VG2 Power Supply: ±(1%+0.1A) ■ Power Supply Limits ・Set Current: 0A to 40A ・Resolution: 1A ・Detection Time: 99uS max, 1uS step ■ Clamp Power Supply ・Output Voltage: 999V max, 1.0V step ・Setting Accuracy: ±(1%F・S+10V) *For more details, please feel free to contact us.
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Our company designs and manufactures measuring instruments and inspection devices for semiconductor elements such as transistors, diodes, and FETs, focusing on their voltage resistance and durability. Since our establishment, we have delivered numerous measuring instruments to various companies. With the know-how we have cultivated from this experience, we take pride in our ability to provide flexible solutions that meet our customers' desired convenience and usability in measurements.