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  3. Measurement and Analysis
  4. Other measuring instruments
  5. Other measurement, recording and measuring instruments
  6. Prover "Full Auto System"

Prover "Full Auto System"

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last updated:Jun 10, 2022

ベクターセミコン
ベクターセミコン
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Equipped with high measurement accuracy and automation features! A prober capable of precise calibration.

Our company offers the "Full Auto System." The "TS2500-RF" is a new full-auto probe system designed for on-wafer RF measurements. It supports wafer sizes up to 200mm and can perform low noise, low leakage measurements within a temperature range from room temperature to a maximum of 300°C. Additionally, we also offer the "TS3500/TS3500-SE" which is compatible with 12-inch wafers. 【Features】 <TS2500-RF> ■ Capable of mounting probes up to 67GHz with 4 ports ■ Supports various measurements such as DC-IV, DC-CV, and Pulsed-IV ■ Can handle wafers as small as 50um *For more details, please refer to the PDF document or feel free to contact us.

    Other measurement, recording and measuring instruments
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Prover "Full Auto System"

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  • Related Link - http://www.vectorsemicon.co.jp/ts2500rf.html

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【Features】 <TS3500/TS3500-SE> ■Designed with five individual trays for ergonomic loading ■Extends the automation of the "TS3500" series without compromising the MPI wafer wallet measurement functionality ■Enables fully automated testing using up to five identical wafers at different temperatures *For more details, please refer to the PDF document or feel free to contact us.

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【Usage】 ■ On-wafer RF measurement *For more details, please refer to the PDF document or feel free to contact us.

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ENGINEERING PROBE SYSTEM 【Product Catalog】

ENGINEERING PROBE SYSTEM 【Product Catalog】

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ベクターセミコン

ベクターセミコン

Electronic Components and Semiconductors

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Vector Semiconductor Co., Ltd. is a company based in Arakawa, Tokyo, that specializes in the manufacturing, sales, and service of probers for research and development in the semiconductor and liquid crystal panel industries. We handle semiconductor analysis equipment, semi-automatic probers, temperature control systems, and other analysis devices.

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