ベクターセミコン Product Lineup

Our company offers the "Full Auto System." The "TS2500-RF" is a new full-auto probe system designed for on-wafer RF measurements. It supports wafer sizes up to 200mm and can perform low noise, low leakage measurements within a temperature range from room temperature to a maximum of 300°C. Additionally, we also offer the "TS3500/TS3500-SE" which is compatible with 12-inch wafers. 【Features】 ＜TS2500-RF＞ ■ Capable of mounting probes up to 67GHz with 4 ports ■ Supports various measurements such as DC-IV, DC-CV, and Pulsed-IV ■ Can handle wafers as small as 50um *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

We handle "Power Device Evaluation Probers." The "TS150-HP/TS200-HP" is a manual prober specifically designed for power device measurements, including 10kV withstand voltage testing and 250A (pulse) current measurement. It can be equipped with a thermal chuck system capable of withstanding up to 10kV and operating at 300°C. In addition, we also offer the cost-effective "TS2000-DP" and the safety-equipped "TS2000-HP." 【Features】 ■ Manual prober specialized for power device measurements ■ Compatible with chip sizes up to a maximum of 6-inch wafer sizes (TS150-HP) ■ Compatible with chip sizes up to a maximum of 8-inch wafer sizes (TS200-HP) ■ Capable of creating a measurement environment that considers safety *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The product is a high-performance semi-automatic prober compatible with up to 12-inch wafers. The "TS3000-SE" is an innovative model that can be introduced at a low cost while supporting various measurements, including 1/f measurements, which were difficult with semi-automatic machines, as well as microcurrent measurements. It can be installed in a very small area, including the chiller unit. 【Features】 ■ "TS3000" - Simultaneous setup of probe card and positioner is possible - Suitable for failure analysis, reliability testing, RF measurements, load pull measurements, etc. - Supports measurements in low-temperature environments while maintaining a wide opening ■ "TS3000-SiPH" - Designed for the characterization of silicon photonics devices - High-precision fiber alignment system with high flexibility - Safe operation is possible *For more details, please refer to the PDF document or feel free to contact us.

• probe

The product is a semi-automatic prober that meets various measurement needs. The "TS2000-SE" is designed for high performance, ultra-low noise, and high precision while reducing testing costs. It delivers top-class performance in all areas, including microcurrent measurement, highly reliable DC/IV measurement, 1/f measurement, RF measurement, and power device measurement. 【Features】 ＜TS2000-SE＞ ■ Supports wafers up to 8 inches ■ Excellent design for EMI and RFI countermeasures and light shielding ■ Automatically performs wafer loading and unloading ■ Capable of temperature control from -60℃ to 300℃ *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments

The ShielDEnvironment manual system 'TS200-SE' is designed with excellent EMI and RFI countermeasures and shielding, and it is a temperature-controlled model that supports various measurements with high and low temperature capabilities. When combined with a temperature control system, it enables low noise and low leakage measurements over a maximum temperature range of -6 to 300℃. 【Features】 ■ 'TS200-SE' - Supports up to 8-inch wafers - Capable of low noise and low leakage measurements ■ 'TS300-SE' - Supports up to 12-inch wafers - Wide platen that accommodates various measurements and settings - Excellent operability with XY stage control (with locking function) - Large yet easy to operate *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments

The millimeter wave and THz measurement manual system 'TS150-THZ' is a product specialized for measuring millimeter waves and sub-millimeter waves using amplifiers, converters, and millimeter wave modules. It simplifies the setup of the measurement system and achieves top-class performance of VNA with excellent accuracy and reproducibility. 【Features】 ■ Seamless integration of wide frequency range measurement extender and prober up to 1.5THz ■ Simplification of the measurement system setup *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The DC/RF measurement manual system "TS150" can be used for various applications and is a customizable product that can be equipped with a metal microscope or laser system. It can be equipped with a temperature control system that ranges from room temperature to 300°C. In addition to the standard types "TS150," "TS200," and "TS300," we also offer a compact tabletop model "TS-50." 【Features】 ■ "TS150," "TS200," "TS300" - Intuitive operation - Simple and convenient - High-precision measurement ■ "TS-50" - Space-saving footprint design (300×300mm) - Efficient configuration and design - Quick setup possible *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The 『IMPACT(TM)』 is a low-cost packaged product that includes accessories for immediate measurement. Despite being a packaged product, it offers flexibility tailored to applications and individual measurements. It is suitable for the DC/CV and RF measurement needs of universities, government agencies, and research institutions. 【Features】 ■ Ready to start measuring immediately ■ Packaged product that includes accessories ■ Flexibility tailored to applications and individual measurements ■ For higher frequencies, options of 40GHz, 50GHz, and 67GHz are available, allowing for measurements at higher frequencies. *For more details, please refer to the PDF document or feel free to contact us.

• others

Our company offers RF probes and calibration substrates with a wide frequency range, pitch, excellent durability, all at a low price. Thanks to our unique tip shape, stable contact can be achieved with minimal skating during contact, reducing damage to devices and ensuring high reproducibility. The calibration assist software already has product data for the "Allstron TITAN Probe Series" registered, allowing you to use it immediately by simply selecting a probe. 【Product List】 ■Allstron RF Probe "TITAN" ■Allstron RF Probe "TITAN-RC" ■RF Calibration Substrates "AC" ■Calibration software "QAlibria" *For more details, please request materials or view the PDF data available for download.

• probe

The "Semi-Auto Probe System" is a system that establishes an accurate and stable automatic measurement environment through excellent mechanical precision and high reproducibility, as well as advanced operation software SENTIO. We introduce a range of products that cater to various measurement applications and needs. Starting with the "TS2000/TS2000-D," which supports wafers up to 8 inches, we have a rich lineup including "TS2000-SE" and "TS3000-SE." [Product List] ■TS2000/TS2000-D ■TS2000-SE ■TS2000-HP ■TS3000 ■TS3000-SE *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments

The "Manual Probe System" is a system specialized for on-wafer measurements that can be used in various applications such as IV/CV measurements, RF measurements, power device measurements, and reliability testing. We introduce a range of products that combine high rigidity, high precision, and excellent operability. From DC/CV to RF measurement applications for chip sizes up to 2-inch wafers, we offer a rich lineup including the cost-effective "TS50" as well as "TS150-HP/TS200-HP." 【Product List】 ■TS50 ■TS150/TS200/TS300 ■TS150-THZ/TS200-THZ ■TS200-SE/TS300-SE ■TS150-HP/TS200-HP *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments

Supports wafers up to 4 inches Equipped with a high-temperature chuck Can also accommodate power device evaluation

• Analytical Equipment and Devices

This is the Vector standard model that supports chip sizes up to 8-inch wafers. It enables the construction of various measurement solutions, including high and low temperature DC measurements, high-frequency measurements, and high-speed IV/pulse IV measurements.

• Analytical Equipment and Devices

This is a high-precision semi-automatic prober capable of handling wafer sizes up to 8 inches. Its low-noise specifications allow it to accommodate various applications. It supports automatic measurement.

• Analytical Equipment and Devices

This is the first 12-inch wafer-compatible semi-automatic prober developed by a domestic manufacturer.

• Analytical Equipment and Devices