Equipped with an electron microscope, it enables load tests, electrical tests, heating tests, etc., with a lineup of attachable models for standalone movable models and SEMs.
Equipped with an SEM, a pyramid-shaped indenter is pressed into a flat sample surface, allowing for precise control and measurement of displacement and load at the nanoscale. From the acquired data, mechanical properties such as hardness and elastic modulus of the sample in extremely small areas can be derived. Our products can be used for various tests such as compression, tension, and scratching by changing the shape and operation of the indenter. - High-precision load and displacement control - Real-time (In-situ) testing and data acquisition while observing the measurement area - Diverse tests including compression, indentation, tension, scratching, and fatigue - Stable measurements even in high-load and long-duration tests - Stress testing while applying voltage and heating
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basic information
It is a mechanical tester or nanoindenter that can be mounted inside an electron microscope (SEM/TEM) to conduct in-situ measurements of the mechanical properties (such as indentation, compression, tension, bending, scratching, vibration, etc.) of micro/nano-sized structures. In the nanoindentation method, the applied load and indentation depth are represented in a load-displacement curve, and the hardness of the material is evaluated by calculating the information obtained from that curve. It also supports electrical testing and heating tests. We offer standalone models equipped with optical microscopes, as well as models that can be attached to SEMs, optical microscopes, synchrotron beams, and more. The minimum load unit is 1 nN, and the minimum displacement detection is 10 pm, allowing for high-precision analysis. In addition to materials such as silicon, quartz glass, and Ni alloys, it can also be utilized in manufacturing processes like deep reactive ion etching (DRIE), LIGA, and laser processing. Furthermore, we provide analysis solutions using Digital Image Correlation (DIC) to analyze the distribution of strain and displacement based on the obtained images.
Price range
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Applications/Examples of results
- Iron and metals - Thin films - Ceramics - Nanofibers and nanotubes
Company information
We are waiting for your inquiries and consultations regarding our products and services, such as the following: ■ Particle Size Distribution and Powder Measurement - I want to replace my particle size analyzer, but it's too expensive to implement. - I want to introduce an easy-to-operate particle size analyzer. - I want to measure particle size distribution in the nano range at a low cost. ■ Fluid Measurement and Visualization - Concerns about the visualization and quantification of fluids. - I introduced PIV software, but I can't measure effectively. - I want to simultaneously measure the flow velocity and particle size of spray particles. ■ Strain and Displacement Measurement - I want to measure strain in areas where strain gauges cannot be attached. - I want to analyze strain and displacement non-contactly. - I want to measure the distribution of strain over a surface. ■ Thin Film and Porous Material Evaluation - I would like to consult about mercury porosimeters that will no longer be usable due to the Minamata Convention. - I want to evaluate the gas diffusion performance of GDL and MEA in fuel cells. - I want to measure the permeability of barrier films at high speed. We welcome any inquiries, no matter how trivial, so please feel free to consult with us. We also have a lab room available for demonstrations and product tours.
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