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  6. Short-Circuit Tolerance Evaluation and Analysis Report

Short-Circuit Tolerance Evaluation and Analysis Report

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last updated:Dec 04, 2019

エルテック
エルテック
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We will measure short-circuit tolerance and clarify the failure mechanism!

LTech Co., Ltd. is selling the "Short-Circuit Withstand Evaluation and Analysis Report." Compared to other SiC MOSFETs that explode at the moment of short-circuit failure, INFINEON CoolSiC MOSFETs fail softly without exploding. This report measures short-circuit withstand capability and clarifies the failure mechanisms. 【Features】 ■ Analysis and evaluation to identify the physical mechanisms that limit the short-circuit withstand capability of advanced SiC transistors based on test measurement data results. ■ Extraction of critical temperature and failure energy up to breakdown. ■ Analysis of the failure mode. ■ Comparison of the short-circuit withstand capability of INFINEON and other companies' 1200V transistors. ■ Clarification of changes in transistor structure and processes to enhance short-circuit resistance. *For more details, please refer to the PDF document or feel free to contact us.

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2019-12-03_14h15_46.png

Short-Circuit Tolerance Evaluation and Analysis Report

2019-12-03_14h15_46.png
2019-12-03_14h15_46.png
  • Related Link - http://www.ltec-biz.com/

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[Importance and Usage of Evaluation Results] ■ It is possible to estimate the minimum response time of the short-circuit protection circuit. ■ By using the measured short-circuit drain current waveform and endurance time (tsc,f) in SPICE electrical and thermal simulations, it is possible to estimate the internal temperature of the transistor. *For more details, please refer to the PDF materials or feel free to contact us.*

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Short-Circuit Capacity Evaluation and Analysis Report

Short-Circuit Capacity Evaluation and Analysis Report

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エルテック

エルテック

Electronic Components and Semiconductors

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Our company is a technology service provider that specializes in delivering technical information (reports) tailored to our customers' needs, utilizing both the semiconductor-based analysis technology we have developed over many years since 1988 and our extensive experience in the investigation and analysis of intellectual property (IP) such as patents.

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