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  3. Measurement and Analysis
  4. Analytical Instruments
  5. Analytical Equipment and Devices
  6. We provide comprehensive support for reliability testing, analysis, and evaluation of electronic components!

We provide comprehensive support for reliability testing, analysis, and evaluation of electronic components!

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last updated:Jun 26, 2025

アイテス
アイテス
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Transitional thermal measurement possible power cycle testing, with a customized luminescence/OBIRCH analysis device, where a skilled team thoroughly evaluates and analyzes power devices!

At AITES, we provide total solution services for power devices, including reliability testing, analysis, and evaluation. This includes the "Power Cycle Testing Machine," which can simultaneously conduct transient thermal measurements, as well as "failure analysis of compound semiconductors," "concentration analysis of diffusion layers," and "cross-sectional analysis of modules." We will make proposals based on specific achievements. Keywords: ■General power semiconductors (chips, module TIM materials, etc.) ■Reliability testing/evaluation ■Structural analysis (quality, competitor product RE) ■Failure analysis (identification of failure points, cause investigation, improvement proposals) 【List of Tests】 ■Power Cycle Testing ■Liquid Tank Thermal Shock Testing ■Gate Bias Testing ■Non-destructive observation of semiconductor/package delamination ■Failure analysis of power chips, etc. *For more details, please refer to the PDF materials or feel free to contact us.

    Analytical Equipment and DevicesAnalysis Services
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We provide comprehensive support for reliability testing, analysis, and evaluation of electronic components!

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2020-03-24_14h18_11.png
  • Related Link - https://www.ites.co.jp
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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catalog(20)

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X-ray fluoroscopy and CT scanner 'Cheetah EVO'

X-ray fluoroscopy and CT scanner 'Cheetah EVO'

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Analysis of semiconductor diffusion layers using sMIM

Analysis of semiconductor diffusion layers using sMIM

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[Information] We will solve the cause of the issue from a chemical perspective.

[Information] We will solve the cause of the issue from a chemical perspective.

OTHER
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Total Support Service for Reliability

Total Support Service for Reliability

OTHER
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Wafer processing

Wafer processing

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Failure analysis of power devices

Failure analysis of power devices

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Reliability testing of materials and chemical analysis evaluation after testing.

Reliability testing of materials and chemical analysis evaluation after testing.

TECHNICAL
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[Data] Transmittance measurement service using a self-recording spectrophotometer

[Data] Transmittance measurement service using a self-recording spectrophotometer

OTHER
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We handle everything from reliability testing of materials to chemical analysis.

We handle everything from reliability testing of materials to chemical analysis.

TECHNICAL
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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

OTHER
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[Data] FT-IR Analysis of Transparent Resin

[Data] FT-IR Analysis of Transparent Resin

OTHER
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[Data] IR Analysis of Vinyl Polymers (Resin Materials)

[Data] IR Analysis of Vinyl Polymers (Resin Materials)

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Cross beam FIB cross-sectional observation

Cross beam FIB cross-sectional observation

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Melt Flow Rate (MFR) Measurement Evaluation Service

Melt Flow Rate (MFR) Measurement Evaluation Service

TECHNICAL
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Analysis of electronic components and materials using TEM.

Analysis of electronic components and materials using TEM.

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Total solution service for power devices

Total solution service for power devices

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Aites Device List

Aites Device List

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Appearance observation and measurement services

Appearance observation and measurement services

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Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

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Rubber heat aging test

Rubber heat aging test

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News about this product(3)

Rubber heat aging test

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Our company conducts "rubber thermal aging tests" that help evaluate the properties of materials in actual usage environments. Using a method compliant with JIS K6257 (Method for determining thermal aging characteristics of vulcanized rubber and thermoplastic rubber), rubber test pieces are suspended in a gear oven to create specimens with varying heat treatment times. Additionally, tensile tests are performed on heated natural rubber (NR) to investigate changes in mechanical properties, while hardness is measured simultaneously. Changes in the characteristics of the rubber are also examined, confirming that rubber elasticity is lost and the material becomes harder with heating.

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Observation of substrate deformation using a 3D shape measuring device (VR-6200)

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I would like to introduce "Observation of Substrate Deformation Using a 3D Shape Measuring Machine." By applying pressure to the PCB substrate, referencing bending tests of plastics and PCB substrates, the change in state is measured using a 3D shape measuring machine (VR-6200). Since the measurement results can be confirmed with a color palette and line profile, it is possible to visually verify the shape and amount of deformation caused by the applied pressure.

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Appearance observation and measurement services

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We would like to introduce our "Appearance Observation and Measurement Service." We are equipped with a variety of devices to meet your needs, including appearance observation before and after reliability testing, solder joint observation, as well as dimensional measurements and surface roughness measurements of various components. You can also leave the pre-observation processing to us. Our company has IPC-certified IPC specialists on staff. We provide assistance with observations, consultations, and solutions to various observation-related concerns in accordance with international standards.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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