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  6. Power cycle testing and characteristic evaluation

Power cycle testing and characteristic evaluation

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last updated:Jun 26, 2025

アイテス
アイテス
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Contracting power cycle tests using a power cycle testing device! We will cooperate in improving quality along with failure analysis and assessment.

At Aites Co., Ltd., we offer contract power cycle testing using Siemens (Mentor) power cycle testing equipment. We can also handle the creation of various jigs necessary for the tests. Additionally, we accommodate various observations and measurements of power devices. We can capture changes before and after tests such as power cycle testing. 【Features】 ■ We can handle the creation of various jigs necessary for the tests. ■ We accommodate various observations and measurements of power devices. ■ We can capture changes before and after tests such as power cycle testing. *For more details, please refer to the PDF document or feel free to contact us.

    Contract AnalysisContract measurementContract Inspection
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Power cycle testing and characteristic evaluation

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  • Related Link - https://www.ites.co.jp/guarantee/index/shinrai/pow…
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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【Device Overview】 <Siemens (Mentor) "PWT2400A"> ■ Equipped with 4 units of 600A power supply for heating ■ Equipped with 16 units of -10V to 20V power supply for gates ■ Capable of testing up to 16 channels simultaneously ■ Tj measurement using a method compliant with JESD51-14 ■ Automatic transient thermal resistance measurement during testing ■ Equipped with a cooling plate that supports up to 200℃ ■ Standard fixtures for TO packages are also included ■ Compatible with water-cooled modules *For more details, please refer to the PDF document or feel free to contact us.*

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catalog(9)

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Total Support Service for Reliability

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Environmental testing in a high-power constant temperature and humidity chamber.

Environmental testing in a high-power constant temperature and humidity chamber.

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Power cycle testing and characteristic evaluation

Power cycle testing and characteristic evaluation

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Module prototyping and thermal resistance evaluation

Module prototyping and thermal resistance evaluation

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HAST test of power devices

HAST test of power devices

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Ultrasonic Microscope 'SAM'

Ultrasonic Microscope 'SAM'

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Reverse bias test of power devices (up to 2000V)

Reverse bias test of power devices (up to 2000V)

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IOL testing of discrete semiconductors

IOL testing of discrete semiconductors

OTHER
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Strain measurement of power module package resin.

Strain measurement of power module package resin.

TECHNICAL
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News about this product(3)

Strain measurement of power module package resin.

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We would like to present the results of strain measurements conducted by attaching strain gauges and thermometers to the surfaces of power modules, both in the mounted state on a circuit board and in the unmounted state. In the mounted module, a slight delay in temperature change was observed, and correspondingly, the change in strain also appeared to be delayed. This is believed to be due to the slower transfer of heat to the module when it is mounted. At Aites, we conduct temperature cycle tests and temperature-humidity cycle tests, during which we can simultaneously measure the strain occurring in the mounted components. Please feel free to consult with us.

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IOL testing of discrete semiconductors

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Our company conducts "IOL testing of discrete semiconductors." We repeatedly turn the power ON/OFF in a room temperature environment, applying stress to the device due to temperature changes caused by the device's own heat generation during power ON. During power OFF (cooling), forced cooling is also performed using a fan. Additionally, before conducting the tests, we use representative samples to make adjustments to reach the test temperature conditions. It is possible to adjust the current/time during heating and the fan capacity/timing during cooling.

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Reverse bias test of power devices (up to 2000V)

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At Aites Co., Ltd., high-temperature reverse bias testing (HTRB) for evaluating the oxide film and junction of power devices can be applied up to a maximum of 2000V. By monitoring the leakage current during the test, the degradation status of the device can be grasped in real-time. Since the power supply is independent, if one device fails during the test, it will not affect the other devices. Additionally, it is possible to set a failure criterion (current value) and to cut off the power supply to the device deemed faulty at the time of failure judgment. 【Specifications and Service Details】 ■ Test Voltage: Up to a maximum of DC 2000V ■ Applied Current: Up to a maximum of 14mA ■ Number of Test Devices: Up to a maximum of 8 (independent power supply) ■ Compatible Modules: TO-247, TO-220, etc. (other packages require consultation regarding connection methods) ■ Measurement Content: Monitoring of leakage current ■ Temperature Range: Up to a maximum of 200°C (85°C/85% in high temperature and high humidity conditions)

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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