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  5. X-ray inspection equipment
  6. X-ray fluoroscopy and CT examination device: Observation case of chip resistors

X-ray fluoroscopy and CT examination device: Observation case of chip resistors

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last updated:Jun 26, 2025

アイテス
アイテス
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CT observation is effective for analysis as it allows for three-dimensional observation! Here, we will introduce examples of observing chip resistors.

We will introduce a case study of observing chip resistors using X-ray fluoroscopy and CT scanning. Chip resistors have a structure where a thin film of metal (the resistive element) is formed on the surface of ceramics. The L-shaped lines seen in the X-ray image are trimming marks applied to adjust the resistance value. CT observation allows for viewing the desired cross-sectional images and enables three-dimensional observation, making it effective for analysis. If any defects are found through X-ray or CT observation, cross-sectional observation and elemental analysis will be conducted to investigate the cause. [Case Study of Chip Resistor Observation] ■ CT Observation - It is possible to view the desired cross-sectional images. - Effective for analysis due to the ability to observe in three dimensions. *For more details, please refer to the PDF document or feel free to contact us.

    Other inspection equipment and devicesX-ray inspection equipment
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X-ray fluoroscopy and CT examination device: Observation case of chip resistors

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  • Related Link - https://www.ites.co.jp/guarantee/index/ndt/xsenct.…
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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【Usage】 ■ X-ray fluoroscopy and CT examination equipment *For more details, please refer to the PDF document or feel free to contact us.

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X-ray fluoroscopy and CT examination device: Observation case of chip resistors

X-ray fluoroscopy and CT examination device: Observation case of chip resistors

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Identification of failure points in electronic components through thermal analysis.

Identification of failure points in electronic components through thermal analysis.

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X-ray observation of electrolytic capacitors

X-ray observation of electrolytic capacitors

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Oblique CT observation of the laminated substrate

Oblique CT observation of the laminated substrate

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Example of failure analysis of chip resistors

Example of failure analysis of chip resistors

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アイテス

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Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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