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  4. Microscopes
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  6. Ultra-wide field confocal laser scanning imager inspection device

Ultra-wide field confocal laser scanning imager inspection device

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last updated:May 18, 2020

オプセル
オプセル
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User customizable! A new inspection device using the optical system of a laser microscope.

This product is a third observation and inspection device that is neither a microscope nor a CCD camera. Due to its laser raster scanning, it has a field of view more than 100 times larger than that of a microscope. By capturing long images (Y-stage movement) and moving the X-axis according to the scanning width, it can capture even broader images. Additionally, we also handle the "Telecen fθ type laser direct drawing device" for drawing on cylindrical surfaces and standard flat substrates, as well as the drawing optical unit "LSU." 【Features of the Ultra-Wide Field Confocal Laser Scanning Imager Inspection Device】 ■ Capable of acquiring images of transparent films and ceramics that are difficult to see with optical microscopes ■ Has a field of view more than 100 times larger than that of a microscope due to laser raster scanning ■ By capturing long images (Y-stage movement) and moving the X-axis according to the scanning width, it can capture even broader images ■ Custom specifications for scanning lenses are also possible *For more details, please refer to the PDF materials or feel free to contact us.

    Microscope
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Ultra-wide field confocal laser scanning imager inspection device

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  • Related Link - https://www.opcell.co.jp/product/product_imager.ht…

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【Telecen fθ Type Laser Direct Drawing Device and LSU Features】 ■ Capable of drawing on cylindrical surfaces as well as on standard flat substrates ■ The "LSU" is designed to be compact, allowing for space-saving installation ■ Usable for small lot production of various types, as well as for test benches ■ Can connect to "LSU," enabling coverage of larger areas *For more details, please refer to the PDF document or feel free to contact us.

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Applications/Examples of results

【Applications】 ■ Observation and detection of surface defects on transparent films and glass ■ Defect inspection of sapphire wafers ■ Detection of micro-crack defects in ceramics ■ Observation of peeling of deposited films ■ Inspection of foreign substances and character chipping on resin relief plates ■ Non-contact shape measurement of small-diameter lenses and small molds ■ Observation of other objects that are difficult to see with optical microscopes *For more details, please refer to the PDF document or feel free to contact us.

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Ultra-wide field confocal laser scanning imager inspection device

Ultra-wide field confocal laser scanning imager inspection device

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オプセル

オプセル

Testing, Analysis and Measurement

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**Business Concept** ● Demonstrating expertise in optical technology As a development-oriented company, we will demonstrate our expertise in optical systems and optical scanning technology. In particular, we will develop, manufacture, and sell devices that use laser scanning technology to measure large areas with high precision or to render images. ● Based on independently developed products Our products will primarily be based on independently developed products, and we will also engage in the production of jointly developed products with other companies and products developed through development requests.

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