オプセル Product Lineup

The "Internal Defect Inspection Device" observes internal defects in transparent materials and liquids using laser light and a special optical system, detecting defects with dedicated image processing software. The maximum size is 2000×2000×500 (height) mm, and the defect detection capability ranges from 1μm (with a dedicated lens) to several mm. Additionally, defect inspection of parts that have been precisely processed after cutting transparent materials is possible with a super wide-field laser scanning imager. 【Features】 ■ Detects defects using laser sheet light with a dedicated optical lens system ■ Maximum size is 2000×2000×500 (height) mm ■ Defect detection capability ranges from 1μm (with a dedicated lens) to several mm ■ Available shapes include cylindrical and rectangular, accommodating both large and small items *For more details, please refer to the PDF document or feel free to contact us.

• Defect Inspection Equipment

The "LSM-4000 Series" is a third type of observation device that is neither a microscope nor a CCD camera. It can capture wide and long images, making it suitable for detailed defect inspection. It is capable of detecting microcracks in ceramics and foreign objects. In addition to this series, we also offer the large laser scanning imager "LSM-6000 Series" and the compact laser scanning imager "LSM-3000 Series." 【Features of the LSM-4000 Series】 ■ Standard laser scanning imager ■ Detection of scratches and foreign objects of a few micrometers on transparent films, sapphire, glass, ceramics, etc. (dual screen display) ■ Detection of repair areas on super barrier films and ITO films ■ Capable of detecting microcracks in ceramics and foreign objects ■ Detects defects at the 0.2μm level with a scanning width of 4mm ■ Scanning lens is interchangeable *For more details, please refer to the PDF document or feel free to contact us.

• Microscope

This document provides an overview of the ultra-wide field laser scanning imager defect inspection device. It includes sections on "Defect Inspection Devices and Laser Scanning Technology," "Development Cases," and "Market Trends and OpCell's Response." We invite you to read it. 【Contents】 1. Defect Inspection Devices and Laser Scanning Technology 2. Development Background and Unique Technology Features 3. Development Cases 4. Market Trends and OpCell's Response 5. Examples of Currently Used Laser Scanning Imagers 6. Applications and User Benefits *For more details, please refer to the PDF document or feel free to contact us.

• Microscope

This document provides an overview of the ultra-wide field laser scanning imager defect inspection device. It includes sections on "Defect Inspection Devices and Laser Scanning Technology," "Development Background and Unique Technology Features," and "Development Case Studies." We encourage you to read it. 【Contents】 1. Defect Inspection Devices and Laser Scanning Technology 2. Development Background and Unique Technology Features 3. Development Case Studies 4. Trends in the Visual Inspection Market and Our Company's Response 5. Examples of Currently Used Laser Scanning Imagers 6. Applications and User Benefits *For more details, please refer to the PDF document or feel free to contact us.

• Microscope

The product is an interferometer using laser scanning. Interference fringes appear with a reflection level similar to glossy paper. It captures changes of 50mm with the interference fringes. Starting with the inverted type "LSMi-7000," which easily shows interference fringes when a sample is placed on a glass surface, we also offer the cylindrical type "LSMi-7500" and the upright type "LSMi-8000." Additionally, we handle the ultra-wide field confocal laser scanning imager "LSM-5100-MH," which can measure 3D shapes in a range of 5×50mm. 【Features】 <Inverted Laser Scanning Interferometer "LSMi-7000"> ■ Scanning range is 30mm×50mm, can be observed enlarged on the monitor ■ Capable of inspecting fine scratches, polishing defects, and chips on ceramics, etc. <Cylindrical Laser Scanning Interferometer "LSMi-7500"> ■ Interference fringes can be observed over the entire surface of the cylinder, allowing for precise inspection of the cylinder *For more details, please refer to the PDF document or feel free to contact us.

• Microscope

This product is a third observation and inspection device that is neither a microscope nor a CCD camera. Due to its laser raster scanning, it has a field of view more than 100 times larger than that of a microscope. By capturing long images (Y-stage movement) and moving the X-axis according to the scanning width, it can capture even broader images. Additionally, we also handle the "Telecen fθ type laser direct drawing device" for drawing on cylindrical surfaces and standard flat substrates, as well as the drawing optical unit "LSU." 【Features of the Ultra-Wide Field Confocal Laser Scanning Imager Inspection Device】 ■ Capable of acquiring images of transparent films and ceramics that are difficult to see with optical microscopes ■ Has a field of view more than 100 times larger than that of a microscope due to laser raster scanning ■ By capturing long images (Y-stage movement) and moving the X-axis according to the scanning width, it can capture even broader images ■ Custom specifications for scanning lenses are also possible *For more details, please refer to the PDF materials or feel free to contact us.

• Microscope