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  6. Cross-sectional polishing service for implementation parts and electronic components.

Cross-sectional polishing service for implementation parts and electronic components.

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last updated:Jun 26, 2025

アイテス
アイテス
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Each part is carefully polished by hand, using an efficient process without waste!

Our company specializes in "cross-section polishing of implemented components and electronic parts." To quickly provide suitable cross-section samples for the observation of various components, we carefully polish each part by hand, using an efficient process without waste. Please feel free to contact us for more information. 【Features】 ■ Quickly providing suitable cross-section samples for the observation of various components ■ Carefully polishing each part by hand, using an efficient process without waste *For more details, please refer to the PDF document or feel free to contact us.

    Processing ContractSurface treatment contract serviceOther contract services
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Cross-sectional polishing service for implementation parts and electronic components.

2020-08-05_10h17_24.png
2020-08-05_10h17_24.png 2020-08-05_10h18_05.png 2020-08-05_10h18_31.png 2020-08-05_10h18_44.png
  • Related Link - https://www.ites.co.jp/section/index/%e5%8a%a0%e5%…
  • Special site - Product/service details - https://pr.mono.ipros.com/ites/product/

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Cross-sectional polishing service for implementation parts and electronic components.

Cross-sectional polishing service for implementation parts and electronic components.

PRODUCT
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Total support service for cross-section grinding, processing, observation, and analysis.

Total support service for cross-section grinding, processing, observation, and analysis.

OTHER
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Measurement of solder crack rate by cross-sectional observation.

Measurement of solder crack rate by cross-sectional observation.

PRODUCT
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[Data] Whisker Analysis by EBSD

[Data] Whisker Analysis by EBSD

OTHER
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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

OTHER
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Observation of aluminum welding joints

Observation of aluminum welding joints

TECHNICAL
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Cross-sectional observation of large samples (expansion valve)

Cross-sectional observation of large samples (expansion valve)

TECHNICAL
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[Data] Structural Analysis of MEMS Components

[Data] Structural Analysis of MEMS Components

OTHER
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Solder Heat Resistance Test (SMD)

Solder Heat Resistance Test (SMD)

TECHNICAL
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Cross-sectional observation of substrate-mounted components.

Cross-sectional observation of substrate-mounted components.

TECHNICAL
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Cross-sectional observation of substrate-mounted components (1) to (6)

Cross-sectional observation of substrate-mounted components (1) to (6)

TECHNICAL
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Ink immersion test for implementation parts (dye and pry)

Ink immersion test for implementation parts (dye and pry)

OTHER
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Introduction to Section Processing and Observation Methods

Introduction to Section Processing and Observation Methods

OTHER
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Evaluation of various implementation boards

Evaluation of various implementation boards

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Evaluation of BGA/CSP solder

Evaluation of BGA/CSP solder

OTHER
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3D construction through mechanical grinding

3D construction through mechanical grinding

PRODUCT
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Continuous current test of multilayer ceramic capacitors

Continuous current test of multilayer ceramic capacitors

OTHER
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Examples of semiconductor observation through mechanical polishing.

Examples of semiconductor observation through mechanical polishing.

OTHER
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Example of analysis of compounds at the interface between SAC solder and Ni pads.

Example of analysis of compounds at the interface between SAC solder and Ni pads.

TECHNICAL
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Observation of CMOS image sensor cross-section by mechanical polishing.

Observation of CMOS image sensor cross-section by mechanical polishing.

TECHNICAL
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Observation of tracking camera cross-section by mechanical polishing.

Observation of tracking camera cross-section by mechanical polishing.

OTHER
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About the curing temperature of epoxy resin free of hazardous substances.

About the curing temperature of epoxy resin free of hazardous substances.

OTHER
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News about this product(9)

About the curing temperature of epoxy resin free from hazardous substances.

  • Product news

We conducted measurements to reconfirm the temperature of heat generation during curing, following the change to a non-toxic epoxy resin. When using a large amount of resin, we apply heat generation prevention treatment for resin embedding. Without this treatment, the temperature can rise up to 138°C during curing. However, by applying the heat generation prevention treatment even with a large amount of resin, we were able to keep the heat generation during curing within 30°C.

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Observation of tracking camera cross-section by mechanical grinding.

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I would like to introduce "Cross-sectional observation of tracking camera using mechanical polishing." Regarding the structure of the tracking camera components, when viewed from above, the lens can be identified. Although it cannot be clearly seen in the X-ray image, the lens is incorporated into the convex part. Additionally, the cross-sectional structure is similar to that of an RGB sensor, featuring a back-illuminated CMOS structure. However, since color information is not necessary for the tracking camera, there is no color filter layer. A jagged uneven shape was observed on the surface of the photodiode.

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Observation of CMOS image sensor cross-section by mechanical polishing.

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At our company, we created a cross-section of the CMOS image sensor component associated with A company's VR goggles through mechanical polishing while keeping the component intact, and we conducted structural observations of the CMOS sensor component. During the observation of the sensor component structure and sensor surface, we removed the glass filter and observed the CMOS sensor surface, where it was noted that the arrangement of the color filters was in a configuration known as a Bayer filter. In addition to mechanical polishing, methods for creating cross-sections include processing with ion beams such as FIB and CP, as well as microtome methods. Consultations are free, so please feel free to contact us if you are unsure about the cross-section creation method.

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Evaluation of various implementation substrates

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At Aites Co., Ltd., we provide a wide range of technical services for evaluation tests of printed circuit boards (mounted boards) equipped with electronic components. We conduct reliability tests, solder joint observations, whisker observations, and cross-sectional observations. We have IPC-A-610 certified IPC specialists on staff who can assist with observations in accordance with international standards, consultations, and various observation-related concerns. Additionally, we offer services such as X-ray observations, appearance inspections, and shape measurements, so please feel free to consult with us when needed.

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Companynews list (106)

Company information

アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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