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  6. Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

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last updated:Jun 26, 2025

アイテス
アイテス
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Observation of samples and elemental analysis are possible! It can be utilized not only in the semiconductor and electronic components fields but also in life sciences and biological fields.

We handle the tabletop SEM (scanning electron microscope) 'TM3030Plus' manufactured by Hitachi High-Tech. It has been half a century since SEM observation became common, and it has become an important observation method in various fields. With the "charge reduction mode" of the tabletop SEM, it is possible to observe and analyze samples that cannot be observed with FE-SEM. This capability is applicable not only in the semiconductor and electronic components fields but also in life sciences and biological fields. 【Features】 - For conductive samples such as semiconductors and electronic components, SEM observation is mainly recommended in normal/conductive mode. - For non-conductive samples such as plastics, paper, rubber, ceramics, and biological samples containing moisture or oil, SEM observation in surface/normal/charge prevention mode is recommended. *For more details, please refer to the PDF document or feel free to contact us.

    Electron microscope
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Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

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  • Related Link - http://www.ites.co.jp/analyze/index.html
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【Specifications】 ■ Acceleration Voltage: 5kV (surface), 15kV (normal, analysis) ■ Maximum Sample Size: 70mm ■ Maximum Sample Thickness: 50mm ■ Electron Gun: Tungsten Filament ■ Detectors ・High-sensitivity Semiconductor-type Reflective Electron Detector ・High-sensitivity Low Vacuum Secondary Electron Detector ■ Observation Modes ・Conductor (Analysis Mode) ・Standard ・Charge Reduction (Low Vacuum) ■ Analysis Device: Bruker AXS QUANTAX Xflash 430H *For more details, please refer to the PDF document or feel free to contact us.

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[Usage] ■ Not only in the semiconductor and electronic components fields, but also in life sciences and biological fields. *For more details, please refer to the PDF document or feel free to contact us.*

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Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

Tabletop SEM (Scanning Electron Microscope) 'TM3030Plus'

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Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

Cross-sectional observation of copper terminals and elemental analysis using SEM/EDX.

TECHNICAL
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Basic Analytical Methods for Similar Yet Distinct Objects

Basic Analytical Methods for Similar Yet Distinct Objects

TECHNICAL
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Observation of the coating film

Observation of the coating film

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Analysis of organic-inorganic composites using FT-IR and EDX.

Analysis of organic-inorganic composites using FT-IR and EDX.

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Analysis of organic-inorganic composite materials using FT-IR and EDX.

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We will introduce an example of analyzing organic-inorganic composite materials using FT-IR and SEM-EDX. FT-IR measurements were conducted on the glossy and non-glossy areas of a PET bottle label, and the IR spectra differed between the glossy and non-glossy areas. Since the non-glossy area resembles the spectrum of acrylic resin, it is considered that the main component is acrylic resin. Additionally, SEM-EDX measurements were performed on both the glossy and non-glossy areas, and EDX spectra and backscattered electron images were obtained, revealing that the non-glossy area contained sulfur (S) and barium (Ba), which were not detected in the glossy area.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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