We will help solve the challenges of advanced materials such as functional materials and nanotechnology materials!
We offer a "Surface Analysis Service" using high-performance analytical equipment. We collect information on the surfaces and interfaces of materials and comprehensively assess these insights to contribute to solving issues such as surface oxidation, contamination, and segregation faced by advanced materials like functional materials and nanotechnology materials. [Analysis Examples] ■ Analysis of foreign substances on wafers ■ Clarification of the film structure of semiconductor multilayers ■ Analysis of multilayer film structures through inclined cutting ■ Analysis of trace contaminants on wafer surfaces ■ Analysis of anomalies in liquid crystal multilayers, etc. *For more details, please download the PDF or feel free to contact us.
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basic information
【Main Equipment】 ■ X-ray Photoelectron Spectroscopy (XPS) ■ Ultraviolet Photoelectron Spectroscopy (UPS) ■ Scanning X-ray Photoelectron Spectroscopy (μ-XPS) ■ Scanning Auger Electron Spectroscopy (SAM) ■ 8-inch Wafer Compatible Auger Electron Spectroscopy, etc. *For more details, please download the PDF or feel free to contact us.
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Company information
Our company was established in 1987 when the analysis and evaluation group separated and became independent from the research and development division of Ube Industries, Ltd. Since then, we have been assisting the development of our customers and society by responding to various needs through top-level analysis and related technologies. We receive requests for various analyses and evaluations, including composition analysis, structural analysis, surface analysis, morphological observation, ultra-trace analysis, and safety assessments for a wide range of industrial customers. In response, we strive to contribute significantly to solving our customers' challenges with our motto of "swiftly, precisely, and reliably," ensuring their satisfaction.
![Beginner's Online Course (e-learning) [Surface Analysis]](https://image.mono.ipros.com/public/product/image/2e7/2000825127/IPROS48976313755521480955.jpeg?w=280&h=280)
![[Analysis Case] Investigation of Watermark Causes](https://image.mono.ipros.com/public/product/image/75c/2000243772/IPROS1760696109213888153.jpg?w=280&h=280)
![Accelerating research and development, [new] surface analysis service launched!](https://image.mono.ipros.com/public/product/image/480/2001535453/IPROS2944828896955495055.jpg?w=280&h=280)
![[Analysis Case] Evaluation of Gas Barrier Membrane of Plastic Containers Using XPS](https://image.mono.ipros.com/public/product/image/a70/2000360405/IPROS9088011826717715957.jpg?w=280&h=280)
