This is a course for those who want to learn surface analysis from the basics. It explains the principles and spectrum examples of TOF-SIMS, RBS, and XPS.
This is a course for those who want to learn about surface analysis from the basics. During the course period, we accept questions related to this course. The following topics are explained in an easy and compact manner: - Surface analysis - TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry (principle, spectrum examples) - RBS: Rutherford Backscattering Spectrometry (principle, spectrum examples) - XPS: X-ray Photoelectron Spectroscopy (principle, spectrum examples) - Measurement examples: Organic EL devices As a benefit of enrollment, we offer a "Question and Answer Service regarding course content," where an analysis expert will respond to inquiries such as "I want to deepen my understanding of the principles of analytical methods" or "I have questions about measurement examples that I would like explained in detail," which may be difficult to convey in video lectures. ◎ For details on how to apply, please visit here: https://www.toray-research.co.jp/service/seminar/online/
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basic information
Course validity period: 3 months (available for viewing at any time during this period) Price: 3,300 yen (tax included) You can apply here: https://www.toray-research.co.jp/service/seminar/online/ *Before applying, please ensure that the sample video for preview confirmation plays without any issues.
Price information
3,300 yen (including tax)
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P1
Delivery Time
P1
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At Toray Research Center, Inc., we provide technical support through analytical techniques and physical property analysis to address various challenges in research and development as well as production fields via contract analysis. Based on our long-standing achievements and extensive experience in analysis and physical property evaluation, we continue to strive to meet the advanced and diverse needs of our customers.
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