Introduction to the measurement principle of wavelength dispersive X-ray spectrometers (WDS) and examples of measurements for 22Ti!
EPMA has seven spectroscopic crystals, and by selecting a spectrometer that matches the wavelength of the target element, it achieves good energy resolution and detection sensitivity, allowing for excellent results in quantitative analysis of trace components and map analysis. This document provides detailed information on the "measurement principle of wavelength dispersive X-ray spectrometers (WDS)" and includes examples such as "measurement example of 22Ti" with illustrations. Please take a moment to read it. [Contents] ■ Wavelength Dispersive X-ray Spectrometer (WDS) ■ Measurement Example: 22Ti *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.