Semiconductor failure analysis, yield analysis, reverse engineering, microdisplay failure analysis.
It is a cost-effective solution that provides rapid results for layer delamination and removal of materials in semiconductor failure analysis. It achieves excellent uniformity and minimal damage over a wide area. By using multiple ion beam etching techniques, it is possible to match the etching rates of different materials in a single layer, allowing for uniform removal of the entire layer regardless of chemical composition.
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In the microelectronics market, there is a movement towards higher performance and higher density semiconductors, and recent designs have been focusing on reducing layer thickness and compacting the structures within the layers. However, applying traditional processing techniques to such chips is labor-intensive and costly, and it tends to lead to a higher likelihood of errors. Due to the difficulty of mechanical sample preparation, beam-based technologies have emerged for device delay processing applications. Ion Beam Delayering allows for the production of large-area samples and enables an accurate and controlled physical analysis processing process.
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Semiconductor failure analysis Yield analysis Reverse engineering Microdisplay failure analysis
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Hakuto Co., Ltd. is a trading company specializing in electronics and providing technical services as a technology trading company and a manufacturer of chemical industrial products, creating a rich future where people and technology coexist by identifying individual needs. Our company was established in November 1953 as a trading company engaged in the import and sale of quartz crystals. The name "Hakuto" is derived from the first character of "Brazil," the origin of quartz, and "Tokyo," representing the east. This name embodies our strong desire to grow as an international trading company that connects not only Brazil and Tokyo but also the wider world. 【Manufacturers/Products Listed on Ipros】 Asahi Kasei / Sensors, Hall elements, ICs Crystal IS / UVC (Deep Ultraviolet) LEDs IMPINJ / RAIN RFID devices, systems, software