A must-see for those who want to measure film thickness in water! Underwater film thickness gauge 'FF8'
Measure SiO2 films (silicon oxide films) on Si substrates in air and water! Measurement using the curve fitting method is possible with the thin film analysis option.
The "FF8" is a non-contact underwater thickness gauge that measures the reflectance of samples (interference waveforms) and analyzes thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. It can measure SiO2 films (silicon oxide films) on Si substrates in both air and water, and with the thin film analysis option, measurements using the curve fitting method are possible. 【Features】 ■ Measures the reflectance of samples and analyzes thickness values using FFT, etc. ■ Can measure the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can also be used for inline thickness measurements ■ Custom specifications can also be accommodated *For more details, please refer to the PDF materials or feel free to contact us.
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【Example of Option Configuration】 ■Multilayer Analysis: Analysis of 2 to 10 layers is possible ■Thin Film Analysis (Curve Fitting Method): Analyzing thin films through curve fitting analysis ■Chromaticity Analysis: Conducting chromaticity analysis through reflection and transmission ■Component Concentration Analysis: Enabling multi-component analysis by allowing customers to measure and register any film components themselves ■Microscope Option ■Automatic Mapping Option ■Multi-Point Simultaneous Measurement Option (for 3CH)
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【Applications】 ■Film thickness measurement ■Measurement of the thickness and refractive index of films and glass *For more details, please refer to the PDF document or feel free to contact us.
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From now on, it is expected that various technologies across a wide range of fields will be utilized in various places. To achieve this, we will strive to respond to various scenarios in the fields of research, development, and production. By integrating optics, electronics, mechatronics, and software, we aim to contribute to a wide range of research, development, and production fields centered around "lighting," "materials," and "pharmaceuticals."
