Microscopic film measurement and non-transparent sample film thickness measurement are also possible! Non-contact film thickness gauge.
It is also possible to dock with your existing microscope! By combining the microscope film measurement with the 2D spectral radiation option, detailed measurements of the in-plane film thickness distribution are also possible.
FF8" measures the reflectance of samples (interference waveforms) and enables non-contact multi-point thickness measurement through the analysis of thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. Options also include microscopic film measurement and thickness measurement of non-transparent samples. In microscopic film measurement, it uses a microscope to reduce the measurement spot size, allowing for thickness measurement in fine areas, such as RGB patterns of color filters or wiring patterns on substrates, which are difficult to measure macroscopically. For non-transparent sample measurement, it calculates the thickness of non-transparent samples by measuring the thickness of the air layer. Typically, measurement methods using light interference cannot measure the thickness of non-transparent samples, but this measurement method makes it possible. *For more details, please refer to the PDF document or feel free to contact us.
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【Example of Option Configuration】 ■Multilayer Analysis: Analysis of 2 to 10 layers is possible ■Thin Film Analysis (Curve Fitting Method): Analyzing thin films using curve fitting analysis ■Colorimetric Analysis: Conducting colorimetric analysis through reflection and transmission ■Component Concentration Analysis: Enabling multi-component analysis by allowing customers to measure and register any film components themselves ■Microscope Option ■Automatic Mapping Option ■Multi-Point Simultaneous Measurement Option (for 3CH)
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【Applications】 ■Film thickness measurement ■Measurement of thickness and refractive index of films and glass *For more details, please refer to the PDF document or feel free to contact us.
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From now on, it is expected that various technologies across a wide range of fields will be utilized in various places. To achieve this, we will strive to respond to various scenarios in the fields of research, development, and production. By integrating optics, electronics, mechatronics, and software, we aim to contribute to a wide range of research, development, and production fields centered around "lighting," "materials," and "pharmaceuticals."
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