Submicron precision micro positioner
All XYZ axes have high resolution at the sub-micron level driven by micrometers. Compatible with all probe arms from Signatone, adaptable to various testing environments. Position fixing can be selected between magnetic and vacuum suction methods. The probe arms come in various types, including pivot and slide heads.
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basic information
【Specifications】 Movement Range: 12.5mm X-Y-Z Resolution: 1 μm Adjustment Screw Pitch: 100 TPI Fixing Method: Vacuum, Magnet (Selectable) Footprint: 76mm x 40mm
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Applications/Examples of results
High-precision probing CV/IV characteristic measurement Failure analysis Four-point resistance measurement High-power probing etc.
Detailed information
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There are various probe arms available depending on the intended use.
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Company information
Business Activities of Our Company 1. Export of semiconductor testing equipment and electronics control devices Export of semiconductor-related equipment and materials, such as ESD/TLP testers and measuring instruments, and ceramic packages developed and manufactured by domestic suppliers. 2. Import and sales of probe stations (probers) and related equipment As the general distributor in Japan, we handle products from Signatone, a U.S. manufacturer and seller of probe systems.
