We will conduct high-temperature and high-humidity bias tests in accordance with automotive standards AEC-Q101 and AQG-3241!
It continuously monitors multiple channels in any temperature and humidity environment. It is capable of measuring small currents during high voltage application (up to 1000V). It supports temperatures from -40 to 150°C and humidity from 30 to 95% rh. This includes leakage measurements of capacitor components, semiconductor products, and insulating materials.
Inquire About This Product
basic information
It is possible to measure currents below µA in reliability tests of power semiconductors and leakage current measurements of insulating materials. ◎ Continuous monitoring (measurement) of microcurrents (up to µA or less) across multiple channels is possible. ◎ Measurement of microcurrents under high voltage application (up to 1000 V) is possible. ◎ Temperature: Supports -40 to 150 ℃, humidity: 30 to 95 %rh. * We can also accommodate measurements outside the above voltage, current, and temperature ranges, so please contact us. ▶ Examples of Use ◎ Evaluation in accordance with AEC-Q101 and AQG-324 (HTRB, HTGB, H3TRB) ◎ Simultaneous measurement of many samples in arbitrary temperature and humidity environments. ◎ Leakage current measurement of capacitor components and semiconductor products. ◎ Leakage measurement of insulating materials. ▶ Challenges in Microcurrent Evaluation and Our Features Errors can occur due to temperature and measurement environments (such as cables and the measurement board itself), making stable measurements a challenge. Additionally, testing a large number of samples simultaneously makes the measurements even more difficult. We achieve highly accurate microcurrent measurements using an environment that we have uniquely developed and constructed.
Price information
Please contact us.
Delivery Time
Applications/Examples of results
Numerous requests from automotive, semiconductor, electronic components, and materials manufacturers! ■ High-Temperature Reverse Bias Test (HTRB), High-Temperature Gate Bias Test (HTGB), and High-Temperature High-Humidity Reverse Bias Test (H3TRB) compliant with AEC-Q101. ■ High-Temperature Reverse Bias Test (HTRB), High-Temperature Gate Bias Test (HTGB), and High-Temperature High-Humidity Reverse Bias Test (H3TRB) compliant with AQG-324.
Detailed information
-
Microcurrent (Multi-channel) Evaluation Equipment
-
Multi-channel evaluation board
Line up（6）
| Model number | overview |
|---|---|
| AEC-Q101 | High Temperature Reverse Bias Test (HTRB) MIL-STD-750-1 M1038 Method A |
| AEC-Q101 | High Temperature Gate Bias Test (HTGB) JESD22 A-108 |
| AEC-Q101 | High Temperature High Humidity Reverse Bias Test (H3TRB) JESD22 A-101 |
| AQG-324 | High Temperature Reverse Bias Test (HTRB) QL-05 IEC 60747-9:2007 section 7.1.4.1 (IGBT) IEC 60747-8:2010 (MOSFET) IEC 60747-2:2016 (diode) IEC 60749-23:2011 |
| AQG-324 | High Temperature Gate Bias Test (HTGB) QL-06 IEC 60747-9:2007 section 7.1.4.1 (IGBT) IEC 60747-8:2010 (MOSFET) IEC 60749-23:2011 |
| AQG-324 | High Temperature High Humidity Reverse Bias Test (H3TRB) QL-07 IEC 60747-9:2007 (IGBT) IEC 60747-8:2010 (MOSFET) IEC 60747-2:2016 (diode) IEC 60749-5:2017 |
catalog（1）
Download All Catalogs
Company information
As a development and design company, we promote the development, design, and evaluation of semiconductor peripheral circuits and application products through simulation technology.
