If the membrane structure and composition information is known in advance, multilayer membranes can also be evaluated through simulation!
We would like to introduce our "Thin Film Evaluation using X-ray Reflectivity Measurement (XRR)." X-ray Reflectivity Measurement (XRR) allows us to obtain information about surface (interface) roughness, film density, and film thickness by fitting the X-ray profile, which shows attenuation and interference fringes near total external reflection, with a calculated profile. Please feel free to contact us if you have any inquiries. 【Thin Films that can be Analyzed】 ■Sample Surface: Mirror-like (Surface Roughness less than 5nm) ■Sample Size: 30mm x 30mm or larger *Please consult us if the size is smaller ■Film Thickness: 2nm to 500nm ■Required Information: Film structure and film composition information *For more details, please download the PDF or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.
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