R, G, B + NIR correction lens - maintains good MTF even when changing from visible light to the NIR (850nm) wavelength range.
The LSM series covers the visible light range from 435nm to the NIR range of 850nm, with advanced correction for chromatic aberration due to wavelength changes. Its greatest feature is that the focus position remains almost unchanged even when switching between R/G/B/NIR and lighting conditions. This allows for a stable inspection environment without the need for readjustment when switching from visible light inspection to NIR inspection. It is designed with a compact M42 mount lens that ensures an effective image circle of φ30mm and a flange back of 12mm. The LSM series maintains high MTF characteristics across a wide wavelength range from visible light to 850nm. Not only does it achieve focus, but it also ensures resolution across wavelengths, making it suitable for high-difficulty inspection applications such as detecting fine defects and material differences. The LSM series fully utilizes the performance of high-resolution line scan cameras. At the same time, it can also be used with general 2K/4K class three-line scan cameras, demonstrating excellent compatibility with existing equipment.
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basic information
A compact design with an M42 mount compatible lens that secures an effective image circle of φ30mm and a flange back of 12mm. The optical design of the LSM series is optimized based on the characteristics of Teledyne e2v's 4-line sensor "EV1S04KM-CLV0150-T," supporting 4K resolution and a pixel pitch of 7µm. Representative examples of cameras include Teledyne e2v's Linea2 and Allied Vision's allPIXA neo 4k CSP color. ● LSM25 Focal length: 25mm Image circle: φ30 FNo.: F2.8 Resolution: 4,096 pixels, 7µm Mount: M42 ● LSM35 Focal length: 35mm Image circle: φ30 FNo.: F2.0 Resolution: 4,096 pixels, 7µm Mount: M42 ● LSM50 Focal length: 50mm Image circle: φ30 FNo.: F2.8 Resolution: 4,096 pixels, 7µm Mount: M42
Price information
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Delivery Time
※The delivery time may vary depending on the quantity, so please feel free to contact us.
Applications/Examples of results
1. Machine Vision / Quality Inspection ● Electronic Components and Semiconductor Inspection: Detection of defects and foreign objects in IC chips, PCB substrates, and flat panels (LCD/OLED). It is optimal for high-speed and high-resolution surface inspection. ● Printed Material Inspection: Identification of print quality, color misalignment, omissions, and pattern defects. It can simultaneously acquire and analyze primary colors and spectra. ● Web Inspection: Real-time detection of omissions in roll materials (paper, film, textiles, etc.) on high-speed conveyor lines. 2. Color & Multi-Spectral Inspection ● Food and Agricultural Product Inspection: Suitable for applications such as assessing the ripeness of fruits and vegetables, detecting internal defects, signs of decay, and identifying foreign objects. ● Crop Sorting: Simultaneous measurement of color, structure, and internal quality enables advanced classification and sorting. 3. Label / Package Inspection ● Packaging Inspection: Inspection of printing, color unevenness, and packaging defects. Information on the transmittance of opaque materials can also be obtained through multiple wavelength data. 4. Other Special Applications ● Applicable to specialized uses such as sports measurement (high-precision line capture like photo finish) and recycling sorting (utilizing the reflective properties of wavelength bands according to material characteristics).
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Company information
We are a manufacturer of machine vision lenses and custom lenses. Since our establishment in 1984, we have developed and produced many custom lenses to meet the needs of customers around the world. Additionally, for customers who are facing difficulties with commercial products or those who are unable to proceed with purchases due to certain conditions, we work together with them to realize custom solutions.
