Announcement of Exhibition Participation and Exhibitor Presentations "eX-Tech2026"
We will be exhibiting at the eX-Tech 2026 microelectronics show within the JPCA Show 2026.
From June 10 (Wednesday) to June 12 (Friday), 2026, we will be exhibiting at the Microelectronics Show eX-Tech 2026, part of the Total Solutions Exhibition for Electronic Devices "JPCA Show 2026," held at Tokyo Big Sight, East Exhibition Hall.
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basic information
**Exhibition Overview** Date: June 10 (Wednesday) - June 12 (Friday), 2026 Venue: Tokyo Big Sight, East Exhibition Hall Booth Number: East Hall 7 eX-15 **Main Exhibition Content** - Evaluation of dispersion state of nanoparticles (Liquid cell SEM observation) - Surface/interface treatment and modification evaluation of polymer materials (XPS, IR, SAICAS, SPM [AFM]) - Surface functional group analysis of polymer materials (Chemical modification XPS) Additionally, presentations by exhibitors are scheduled during the exhibition period. **Exhibitor Presentation** Date and Time: June 12 (Friday) 12:55 - 13:15 Venue: East Hall 3, Seminar Room 5 Title: "Solving Product Development Challenges through Material Analysis that Unravels 'Why?'" We will introduce challenges arising in product development through specific material analysis examples such as XPS, TG-MS, lifespan prediction, and in-liquid observation.
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When you visit, please be sure to stop by our booth. If you have specific topics of interest in mind, we can also arrange individual explanation sessions.
Company information
Kaneka Techno Research Co., Ltd. was established in 1988 with the corporate philosophy of becoming a trusted partner for our customers in the fields of "analytical services" and "technical information services." As a group of professionals with foresight and advanced analytical and research techniques, we aim to propose solutions to the challenges faced by our customers and to provide high-quality technical services quickly, thereby becoming a trusted problem-solving technical service company. We will continue to strive for improvement every day. We sincerely request your continued guidance and support.
![[Analysis Case] Characterization of Culture Medium](https://image.mono.ipros.com/public/product/image/95e/2000656034/IPROS93531127289564224896.png?w=280&h=280)
![[Analysis Case] Characterization of Glycosylated Proteins (LC-TOFMS)](https://image.mono.ipros.com/public/product/image/e9f/2000678838/IPROS86699163052104343346.gif?w=280&h=280)
![[Analysis Case] Investigation of Contamination Causes on Silicon Wafers](https://image.mono.ipros.com/public/product/image/781/2000246615/IPROS7340715619926776172.jpg?w=280&h=280)
![[Analysis Case] Evaluation of Silicon (Si) Oxide Film State](https://image.mono.ipros.com/public/product/image/c5a/2000245605/IPROS37065991160639091217.jpeg?w=280&h=280)
![[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS](https://image.mono.ipros.com/public/product/image/eec/2000026065/IPROS55327712457248335974.jpeg?w=280&h=280)
![[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order](https://image.mono.ipros.com/public/product/image/d06/2000428831/IPROS14884968757516307941.jpg?w=280&h=280)
![[Analysis Case] Depth Direction Analysis of Polyimide Components](https://image.mono.ipros.com/public/product/image/117/2000244279/IPROS6468602514540796181.jpg?w=280&h=280)
