Detects defects not visible in visible light. High-speed SWIR line scan camera with 12.5μm pixels.
The "WAL-1001-GE" is an industrial SWIR line scan camera equipped with an InGaAs sensor. By capturing images in the SWIR wavelength range of 900 to 1700 nm, it visualizes the composition, moisture content, subsurface defects, and black plastics of materials that are difficult to identify under visible light, with high contrast. With large pixels of 12.5 μm and a high sensitivity design featuring a peak quantum efficiency of 83%, it captures clear images even in low light environments and during high-speed shutter operation. It can output up to 14 bits (16,384 levels), allowing for precise identification of subtle brightness differences. 【Features】 ■ InGaAs line scan camera (1K) compatible with SWIR range (900-1700 nm) ■ Achieves high image quality with excellent S/N ratio and low light sensitivity due to large 12.5 μm pixels ■ Maintains image quality in high-speed shutter and low light environments with a peak quantum efficiency of up to 83% ■ High-speed scanning with a maximum line rate of 29 kHz (GigE Vision) ■ Outputs 8 to 14 bits (up to 16,384 levels) for high-definition representation of fine differences * For detailed spectral sensitivity characteristics and dimensional drawings, please refer to the PDF materials.
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basic information
■Main Specifications - Line Resolution: 1K (1 × 1024 pixels) - Line Rate: 29 kHz - Interface: GigE Vision - Supported Wavelength: Short-Wave Infrared (SWIR) 900–1700 nm - Sensor: InGaAs (Single Sensor) - Pixel Size: 12.5 × 12.5 μm
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Applications/Examples of results
■ Food Sorting and Quality Control - Non-destructive detection of internal quality: Detects bruises, ripeness differences, and early-stage mold in fruits and vegetables using SWIR absorption characteristics. Automatically eliminates agricultural products with internal abnormalities even if their appearance is normal. - Visualization of moisture content: Utilizes the property of water to strongly absorb specific SWIR wavelengths (around 1450nm) to non-destructively inspect for spoilage and dryness inconsistencies in agricultural products. ■ Semiconductor and Wafer Inspection - Non-destructive detection of internal defects: Utilizes the property of SWIR light to penetrate silicon for the rapid detection of internal cracks, subsurface damage, and defects in the dicing process on the manufacturing line. ■ Recycling and Foreign Object Inspection - Material identification and sorting: Automatically identifies plastics, paper, and fibers by material on a high-speed conveyor. Capable of sorting black plastics, which are difficult to detect with visible light or NIR. ■ Pharmaceutical and Packaging Inspection - Filling and sealing inspection: Non-contact verification of filling levels in glass and plastic containers. Detects bubbles and sealing defects in heat seals on continuous production lines.
Company information
JAI is a manufacturer of industrial imaging equipment that supplies high-performance CMOS/CCD cameras across a wide range of fields, including machine vision (inspection and measurement of various industrial products), medical, science, and ITS (intelligent transportation systems). We offer a wide range of products, primarily area scan and line scan cameras, with resolutions ranging from VGA to 20 million pixels. Our unique feature is that we provide not only single-chip cameras but also innovative multi-chip cameras developed based on our proprietary prism technology.
