Achieving 2K high resolution with pixel shift technology. SWIR line scan camera supporting up to 40 kHz.
The WAL-2001-GE is an industrial SWIR line scan camera that achieves 2K high-resolution output through pixel shift technology. It generates a 2K (2048 pixel equivalent) output from a compact InGaAs sensor, accurately detecting the composition, moisture content, and subsurface defects of materials that are difficult to identify in visible light within the SWIR wavelength range of 900 to 1700 nm. With large pixels of 12.5 μm and a high-sensitivity design featuring a peak quantum efficiency of 83%, it captures clear images even in low-light environments and during high-speed shutter operation. It can output up to 14 bits (16,384 levels), allowing for precise identification of subtle brightness differences. 【Features】 ■ Achieves 2K resolution from a 1K InGaAs sensor using pixel shift technology ■ Delivers high-quality images with excellent S/N ratio and low-light sensitivity thanks to 12.5 μm large pixels ■ Maintains image quality in high-speed shutter and low-light environments with a peak quantum efficiency of up to 83% ■ High-speed scanning with a maximum line rate of 40 kHz (GigE Vision) ■ Outputs 8 to 14 bits (up to 16,384 levels) for high-definition representation of fine differences *For detailed spectral sensitivity characteristics and dimensional diagrams, please refer to the PDF materials.
Inquire About This Product
basic information
■Main Specifications ・Line Resolution: 2K (Pixel Shift Method) ・Line Rate: 40 kHz ・Interface: GigE Vision ・Supported Wavelength: Short-Wave Infrared (SWIR) 900–1700 nm ・Sensor: InGaAs (Single Sensor) ・Pixel Size: 12.5 × 12.5 μm
Price information
For more details, please feel free to contact us.
Delivery Time
※For more details, please feel free to contact us.
Applications/Examples of results
■ Food Sorting and Quality Control - Non-destructive detection of internal quality: Detecting bruises, ripeness differences, and early-stage mold in fruits and vegetables using SWIR absorption characteristics. Automatically eliminating agricultural products that appear normal on the outside but have internal abnormalities. - Visualization of moisture content: Utilizing the property that water strongly absorbs specific SWIR wavelengths (around 1450nm) to non-destructively inspect for spoilage and uneven dryness in agricultural products. ■ Semiconductor and Wafer Inspection - Non-destructive detection of internal defects: Using the property of SWIR light to penetrate silicon for the rapid detection of internal cracks, subsurface damage, and defects in the dicing process on the production line. ■ Recycling and Foreign Object Inspection - Material identification and sorting: Automatically identifying plastics, paper, and fibers by material on a high-speed conveyor. Capable of sorting black plastics, which are difficult to detect with visible light or NIR. ■ Pharmaceutical and Packaging Inspection - Filling and sealing inspection: Non-contact verification of the filling level inside glass or plastic containers. Detecting bubbles and sealing defects in heat seals on continuous production lines.
Company information
JAI is a manufacturer of industrial imaging equipment that supplies high-performance CMOS/CCD cameras across a wide range of fields, including machine vision (inspection and measurement of various industrial products), medical, science, and ITS (intelligent transportation systems). We offer a wide range of products, primarily area scan and line scan cameras, with resolutions ranging from VGA to 20 million pixels. Our unique feature is that we provide not only single-chip cameras but also innovative multi-chip cameras developed based on our proprietary prism technology.
