Stable high-sensitivity imaging with built-in TEC cooling. Industrial area scan camera supporting visible light + SWIR from 400 to 1700 nm.
The "WAA-1300-GE-TEC" is an industrial area scan camera with a wide bandwidth (visible light + SWIR) that covers 400 to 1700 nm. It features a built-in Peltier cooling (TEC) system, enabling stable high-sensitivity imaging over long periods while minimizing dark noise. It visualizes the composition, moisture content, and internal defects of materials that are difficult to identify with standard visible light cameras, with high contrast. It supports 1.3 million pixels (1280 × 1024), up to 90 fps, and utilizes a GigE Vision interface, making it suitable for high-speed industrial inspection. 【Features】 ■ InGaAs area scan camera compatible with a wide bandwidth from visible light to SWIR (400 to 1700 nm) ■ Built-in Peltier cooling (TEC) reduces dark noise and enables stable long-term operation ■ 1.3MP (1280 × 1024), up to 90 fps, with global shutter ■ Flexible imaging settings with ROI and binning functions ■ Easy integration into standard network environments with GigE Vision interface *For detailed spectral sensitivity characteristics and dimensional diagrams, please refer to the PDF materials.
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basic information
■Main Specifications ・Resolution: 1.3 MP (1280 × 1024 pixels) ・Frame Rate: Up to 90 fps ・Interface: GigE Vision ・Supported Wavelength: Visible light + SWIR (400–1700 nm) ・Sensor: InGaAs (IMX990) ・Pixel Size: 5.0 × 5.0 μm
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Applications/Examples of results
■ Food Sorting and Quality Control - Non-destructive detection of internal quality: Detect bruises, moisture variation, ripeness, and early decay using visible light + SWIR imaging. Automatically identify the quality of agricultural products that cannot be judged by appearance alone. ■ Semiconductor Manufacturing and Inspection - Visualization of alignment marks: Utilize the property of SWIR light to penetrate silicon to non-destructively detect alignment marks beneath the silicon layer. Contribute to precise alignment in the manufacturing process. ■ Plastic Packaging Inspection - Heat seal inspection: Enhance the contrast of transparent and translucent packages in the SWIR band to reliably detect defects in heat seal areas and sealing failures on a continuous line. ■ Laser Measurement - Beam profiling: Precisely measure the beam shape, intensity distribution, and alignment of high-power lasers using area scanning + SWIR sensitivity. Achieve safe evaluation of high-power lasers that is difficult with visible light cameras. ■ Recycling Resource Sorting - Material identification: Identify materials in large and irregular waste using SWIR. Can also be utilized for verifying sorting quality and pre-evaluating the introduction of new sorting standards.
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JAI is a manufacturer of industrial imaging equipment that supplies high-performance CMOS/CCD cameras across a wide range of fields, including machine vision (inspection and measurement of various industrial products), medical, science, and ITS (intelligent transportation systems). We offer a wide range of products, primarily area scan and line scan cameras, with resolutions ranging from VGA to 20 million pixels. Our unique feature is that we provide not only single-chip cameras but also innovative multi-chip cameras developed based on our proprietary prism technology.



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