Points for understanding measurement and analysis from the basics and applying them in practice.
This seminar is a course that visually and systematically explains the fundamentals to applications of spectroscopic ellipsometry, as well as measurement and analysis know-how. Participants will learn the essence of dielectric constant and refractive index, the basics and principles of spectroscopic ellipsometry, and through demonstrations of fitting analysis, they will learn how to proceed with analysis and key points for constructing optical models. Case studies on multilayer films, effective medium approximation, surface roughness, and optically anisotropic films will also be covered. *For more details, please check the related links or the seminar details in the catalog.*
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<Event Information> Format: Online lecture via Zoom Date and Time: October 23, 2026 (Friday) 10:00 AM - 4:00 PM Participation Fee: 49,500 yen per person (tax included) Instructor: Toshiyasu Tadokoro
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<Seminar Program (Tentative)> Chapter 1: Introduction Chapter 2: Interaction of Matter and Light Chapter 3: Spectroscopic Ellipsometry Chapter 4: Practical Measurement and Analytical Points Chapter 5: Conclusion
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We support Japan's "monozukuri" (manufacturing) with reliable services ranging from patent research and other intellectual property business solutions to technical translation services and intellectual property/engineer education. We offer high-quality services backed by over 40 years of experience at reasonable prices.
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