Contracted services using surface element analysis equipment | JTL
Equipment > Analytical Equipment > Surface Element Analysis Device
We will support elemental analysis of surfaces (surface layers) using EDX/WDX analysis equipment.
The analysis service using surface element analysis devices primarily focuses on EDX (Energy Dispersive X-ray Analysis) and WDX (Wavelength Dispersive X-ray Analysis) within surface element analysis. We select the analysis device and method based on the analysis purpose, target elements, sample condition, and the impact on the sample, providing the most suitable data for your request. We can accommodate various elemental analyses, including component analysis of foreign substances, composition analysis of unknown samples, confirmation of the distribution of each element in alloy layers, color mapping of contaminants, material identification of steel, and quantitative analysis of harmful substances, including sample preparation (cutting, polishing, deposition, etc.).
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basic information
Overview of Surface Element Analysis Equipment The analysis services provided by the surface element analysis equipment primarily focus on EDX (Energy Dispersive X-ray Analysis) and WDX (Wavelength Dispersive X-ray Analysis) methods for surface element analysis. We select the appropriate analysis equipment and methods based on the analysis objectives, target elements, sample conditions, and potential impacts on the samples, ensuring the provision of optimal data for your requests. We can accommodate various elemental analyses, including component analysis of foreign substances, composition analysis of unknown samples, verification of the distribution of each element in alloy layers, color mapping of deposits, material identification of steel, and quantitative analysis of harmful substances, including sample preparation (cutting, polishing, deposition, etc.).
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Applications/Examples of results
- Field Emission Electron Probe Microanalyzer (FE-EPMA) - X-ray Fluorescence Analysis System (XRF) - Microbeam Analysis System (RBS/ERDA) - Photoelectron Spectroscopy Analysis System (ESCA/XPS) - Secondary Ion Mass Spectrometry (SIMS) - Atomic Force Microscope (AFM)
Company information
Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.
![[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.](https://image.mono.ipros.com/public/product/image/d3e/2000325882/IPROS6547567656230940718.jpg?w=280&h=280)
