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  6. Composite X-ray Excitation Photoelectron Microscope Review PEEM

Composite X-ray Excitation Photoelectron Microscope Review PEEM

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Review PEEM

last updated:Oct 01, 2010

C503235 C503235
C503235 C503235
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Compound X-ray Excitation Photoelectron Microscope Review PEEM

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    Electron microscopeMicroscope
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Composite X-ray Excitation Photoelectron Microscope Review PEEM

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review peem.jpg

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A combined device for chemical state analysis and micro-imaging that enables on-site measurement of electrical characteristics. 【Features】 ○ Micro-imaging of chemical states, which was difficult to achieve without bringing samples to a synchrotron facility, is now possible for lab use, with easy switching to XPS spectral analysis. ○ Ideal for a wide range of applications, not only for microscopic chemical state analysis of organic and inorganic electronic devices but also for chemistry, materials, catalysis, and environmental studies. ○ Compared to mapping, imaging allows for rapid visualization, enabling dynamic observation of reactions and changes. ○ Resolution of less than 50μm. ○ Large samples (90mmφ) can be analyzed non-destructively as they are. ○ Imaging of areas up to 50mm×18mm. ○ Simple and quick measurement operation. ● For other functions and details, please download the catalog.

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Compound X-ray Excitation Photoelectron Microscope Review PEEM

Compound X-ray Excitation Photoelectron Microscope Review PEEM

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C503235

C503235 C503235

Testing, Analysis and Measurement

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Hokkaido Koden Co., Ltd. is a core company of a consortium established in June 2008 based on the results of the Ministry of Economy, Trade and Industry's regional revitalization consortium research and development project "X-ray microscope capable of simultaneous observation, chemical analysis, and electrical property measurement." It is built on collaboration between Hokkaido University, Hokkaido Industrial Technology Center, Sugaseisaku Co., Ltd., Hayasaka Riko Co., Ltd., Tanaka Co., Ltd., and JEOL Ltd. With "photoelectron" as a keyword, we will launch ReviewPEEM, which enables simultaneous surface analysis imaging, chemical state analysis, and electrical property measurement in fields such as catalysis, reactions, and organic devices, from Hokkaido.

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