[TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry

In October 2016, MST will introduce the latest high-resolution TOF-SIMS and begin analysis services. We will provide analysis services across a wide range of fields, including pharmaceuticals, biotechnology, medical devices, and product development and quality control related to electronics. Building on our proven TOF-SIMS analysis technology, we will further support our customers' research and development with high-quality data. For more details, please visit the URL below. http://www.mst.or.jp/corporate/tabid/1211/Default.aspx Introduction of analysis examples: • Introduction of new TOF-SIMS services [for pharmaceuticals, biotechnology, and medical devices] http://www.mst.or.jp/special/tabid/1194/Default.aspx • Introduction of new TOF-SIMS services [for the electronics field] http://www.mst.or.jp/special/tabid/1210/Default.aspx

Alkali metals such as Li, Na, and K are key elements in various failure causes in semiconductors. These are referred to as mobile ions that can move within the film during measurement, making it difficult to obtain an accurate distribution. In this study, by conducting depth profiling analysis using a C60 (fullerene) sputter ion source in TOF-SIMS, it was found that the movement of alkali metals can be suppressed even at room temperature. This measurement allows for qualitative and quantitative analysis of impurities within SiO2 films. ★★★★★★★★★★★★★★★★★ 　Please see the link for the analysis data ★★★★★★★★★★★★★★★★★

MST will strongly support the development of organic EL through analysis services! We have established a measurement environment to estimate the raw materials of the stacked organic films in organic EL panels, which have become more refined due to the high resolution of pixels. Through device evaluation and degradation assessment, MST will contribute to your research and development. ★★★ Analysis cases introduced this time ★★★ - Depth analysis of organic material degradation components ~ Component evaluation of organic EL degradation layers ~ - Depth analysis of polyimide components ~ Surface modification layer evaluation of organic materials is possible ~ - Depth analysis of organic EL components ~ Evaluation of organic components in micro pixel areas ~ [This is a new service!] Thanks to the new sputtering conditions of TOF-SIMS, depth analysis can now be performed without damaging organic components. - Structural estimation of organic EL materials ~ Case study of material structure estimation using Q-Tof type LC/MS/MS ~ ******************************************* For detailed data, please see the link! *******************************************

Chitosan is used in a wide range of fields such as medicine, food, cosmetics, and clothing due to its antibacterial and moisturizing properties. Some cotton swabs, which are everyday items, are formulated with chitosan to provide antibacterial effects. Therefore, we evaluated the chitosan contained in cotton swabs using TOF-SIMS, which allows for visualization through mapping and component assessment through spectral measurement. ★★★★★★★★★★★★★★★★★ Please see the linked page for analysis data. ★★★★★★★★★★★★★★★★★