- Capable of evaluating periodic structures and orientation at the nanoscale.
SAXS is an analytical method that measures the X-rays scattered by a substance when X-rays are irradiated onto it, specifically in the low-angle region where 2θ < 10°. It is used to evaluate the structure of materials. Typically, it can assess structures ranging from a few nanometers to several tens of nanometers in size. - Enables evaluation of periodic structures and orientation at the nanoscale - Allows assessment of the distribution of voids in fine particles and materials - Capable of evaluating biological materials such as proteins - Allows for evaluation of samples under heating
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basic information
■Scattering due to periodic structures Scattering due to periodic structures yields profiles like (1). The periodicity of the structural units appears as peaks. By observing the scattered X-rays in the low-angle region, it is possible to measure periodic structures at the molecular level, ranging from a few nanometers to several tens of nanometers. ■Scattering within particles In scattering within particles, profiles like (2) are obtained. The slope of the profile reflects the size of the particles (voids), and the shape reflects the shape and size distribution of the particles. X-rays scattered at wide angles ⇒ Evaluation of interplanar spacing, strain, and orientation of crystals on the order of ? X-rays scattered at low angles ⇒ Evaluation of periodicity and orientation of molecules on the nano order.
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Applications/Examples of results
- Evaluation of crystallinity and orientation of polymer materials - Analysis of higher-order structure and microphase separation structure of liquid crystal samples - Particle size analysis of polystyrene nanoparticles - Evaluation of domain size in polymers
Detailed information
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Please consult with us first. ★ We will start with a proposal for an analysis plan ★ We can, of course, meet at your company for discussions. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars with engineers tailored to your needs ★ We will introduce analytical techniques and explain analytical data according to your requests. ◆ Example seminar content - A broad explanation of MST analytical methods - A detailed explanation of specific analytical methods from the principles - Explanation of the analytical data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
