Research and Development FT-IR VERTEX 70v/80/80v

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last updated：Dec 02, 2024

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VERTEX is a high-end research FT-IR used by cutting-edge research institutions around the world.

The VERTEX 70v series FT-IR spectrometer is one of Bruker's representative technologies and is an ideal system as an entry model for research and development applications, based on the highly regarded RockSolid interferometer used in various fields. The VERTEX 80 series is a high-end research FT-IR (Fourier Transform Infrared Spectrometer) equipped with the UltraScan interferometer featuring Bruker's unique active alignment mechanism, enabling high resolution and ultra-fast data sampling. Both systems guarantee ultimate sensitivity and stability in cutting-edge applications, thanks to high-precision interferometers and high-quality optical components that allow for step scanning and ultra-fast rapid scan measurements with a bright optical system.

Related Link - https://www.bruker.com/jp/products/infrared-near-i…

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basic information

【Features】 ○ Maximum resolution 0.07 cm-1 (80 series option) ○ High sensitivity S/N ratio of 50000:1 or higher ○ Network connection (Ethernet) ○ Expandable from far infrared to ultraviolet range ○ Removal of water vapor and other substances that cannot be eliminated by purging through vacuum (70V 80V) ○ Automatic accessory recognition and setting function ○ Self-diagnosis function ○ Excellent external expandability with multi-optical accessory ports ○ Ability to attach multiple external accessories simultaneously ○ Supports high-speed scan and step scan time-resolved measurements ○ 24-bit ADC DigiTect detector system ● For more details, please contact us or download the catalog.

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Applications/Examples of results

【Research and Development】 - Identification of metamaterials - Highest resolution suitable for gas analysis, above 0.06 cm-1 - Accessories for vacuum-type FT-IR beamline installation - Stop-flow method for enzyme catalyst experiments - Sample chamber connection mechanism for ultra-high vacuum measurements - In-situ analysis of surface electrodes and electrolytes 【Pharmaceuticals】 - Molecular structure analysis (VCD) - Stability and formulation component analysis using thermal analysis (TGA-FT-IR) - Polymorphic identification of pharmaceutical raw materials in the far-infrared region 【Polymer and Chemistry】 - Identification of inorganic fillers in polymers in the far-infrared region (VERTEX FM) - Identification of volatile substances and specification of decomposition processes using thermal analysis (TGA-FTIR) - Identification of inorganic minerals and their content 【Surface Analysis】 - Identification and analysis of thin films such as monomolecular films - Surface analysis using polarization modulation (PM-IRRAS) 【Materials Science】 - Identification of optical and highly reflective materials (windows, mirrors, etc.) - Dark material and depth profile analysis using PAS - Analysis of the radiative properties of materials 【Semiconductors】 - Identification of oxygen and carbon substances in silicon wafers - Low-temperature NIR photoluminescence analysis of impurities during quality control