The four-probe method allows for easy measurement of the sheet resistance of conductive materials.
This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.
Inquire About This Product
basic information
This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.
Price information
-
Delivery Time
※-
Applications/Examples of results
It is possible to accurately measure the resistivity of silicon wafers and the like.
Company information
We believe that our commitment to precision, born from a unique "new technology," is the value we provide to our customers.
![Resistance rate / Sheet resistance measuring instrument [NC-10]](https://image.mono.ipros.com/public/product/image/0b0/215440002/IPROS_17436793690022820000.jpg?w=280&h=280)
![Resistance rate / Sheet resistance measuring instrument [WS-3000]](https://image.mono.ipros.com/public/product/image/9e5/215440005/IPROS_17039821349121462000.jpg?w=280&h=280)
![Resistance rate / Sheet resistance measuring instrument [RT-3000/RG-1000F]](https://image.mono.ipros.com/public/product/image/c68/215440012/IPROS_13940550127942627000.JPG?w=280&h=280)
