The four-probe method allows for easy measurement of the sheet resistance of conductive materials.
This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.
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basic information
This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.
Price information
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Delivery Time
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Applications/Examples of results
It is possible to accurately measure the resistivity of silicon wafers and the like.
Company information
We believe that our commitment to precision, born from a unique "new technology," is the value we provide to our customers.
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