エヌピイエス Product Lineup

This is a manual type measuring device that uses the four-probe method to easily and accurately measure the sheet resistance or resistivity of semiconductor and metal thin films. The measurement capability ranges from 1.000 mΩ-cm to 500 KΩ-cm.

• Electrical Instruments/Electrometers

High-performance tools for professional engineers! The microwave probe manufactured by GGB in the USA is a test probe for microwave devices that combines low loss and high durability through GGB's unique continuous coaxial structure (patented). The leaf spring-type ground chip structure and edge contact method achieve low contact resistance and good measurement reproducibility.

• Other FA equipment

◆This is a high-performance low-input-capacitance probe unlike any other manufacturer. ◆MODEL35, like other active probes from GGB, covers a wide bandwidth with a single tungsten needle for signal, allowing for high-precision testing even of internal nodes, greatly simplifying the process. ◆The probe tip, which is a consumable part, can be replaced by the user, and the tip radius (R) is available from <0.1 microns, accommodating a variety of probing needs. ◆A dedicated power supply, MODEL PS-3, is required for use.

• Semiconductor inspection/test equipment