Slit Intersecting Depth and Height Measuring Device
Slit Intersecting Depth and Height Measuring Device
A light-sectioning measurement microscope that uses slit light for non-contact measurement of height and depth in units of 1 μm.
It is an optical sectioning measurement microscope that uses slit light to measure height and depth in units of 1 μm without contact.
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basic information
【Features】 ○ Changed the illumination of the projection slit, incident lighting, and reference slit to a combination of halogen and fiber optics. ○ Suitable for long measurement tasks with stable brightness in both area and spot illumination. ○ Large sample stage to accommodate larger measurement objects.
Price information
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Delivery Time
P4
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Applications/Examples of results
【Applications】 ○ Height measurement of thick film ICs ○ Height measurement of sealants for adhesion ○ Variation in height displacement of lead frame pin tips ○ Height measurement of chamfer on the edge surface of discs
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Company information
We handle the entire process in-house, from design to lens polishing, machining, and assembly adjustments, allowing us to quickly and economically produce custom optical devices.
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