List of Measurement and Analysis products
- classification:Measurement and Analysis
6211~6225 item / All 55299 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Support from product planning to filling, processing, and shipping for additives, cleaning agents, chemicals, deodorizing and disinfecting agents, etc.! For those who have raw materials but no place t...
- Other consumables
- Processing Contract
Estimation of components is possible through TOF-SIMS analysis.
- Contract Analysis
You can visualize the diffusion layer structure of SiC devices.
- Contract Analysis
Quantitative analysis of the main components of sheet-like active substances is possible.
- Contract Analysis
- Contract measurement
It is possible to evaluate the structure of the Si anode after charging through sample cooling.
- Contract Analysis
- Contract measurement
Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.
- Contract Analysis
- Contract measurement
Detection cases of stacking faults in SiC.
- Contract Analysis
Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.
- Contract Analysis
Even with a structure that has uneven surfaces, depth distribution evaluation is possible through flattening processing.
- Contract Analysis
Evaluation of crystal orientation, in-plane defect distribution, surface roughness, and impurities.
- Contract Analysis
Evaluation of the activation rate of the Dopant is possible.
- Contract Analysis
Analysis is possible after selectively removing the compound layer through preprocessing.
- Contract Analysis
You can measure the 300mm wafer as it is.
- Contract Analysis
Clear visualization of the layer structure of multilayer films using low-damage sputtering with GCIB.
- Contract Analysis
Capable of nano-order morphological observation and elemental analysis.
- Contract Analysis
Quantification of Si-H and N-H in SiN films using infrared absorption method.
- Contract Analysis