List of Electronic Measuring Instruments products
- classification：Electronic Measuring Instruments
796～810 item / All 5054 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
The density correction setting range is 0.50 to 1.90 g/cm³! A simple action of just pulling the platinum ring away from the liquid surface.
- Other electronic measuring instruments
SXRTO wideband oscilloscope 9404A series that combines two functions: real-time and sampling oscilloscope.
- oscilloscope
Expansion of the 9404A series sampler extended real-time oscilloscope.
Pico Technology (headquartered in Cambridge, UK) has added three new models of 6 GHz, 16 GHz, and 33 GHz to the existing 25 GHz model, the PicoScope 9404A-25, providing users with a wide range of options. The 33 GHz model features a rise time of less than 12 picoseconds, enabling high-precision measurements of fast signals. All models in the 9404A series have a vertical resolution of 12 bits and boast an RMS jitter performance of 1.5 picoseconds.
SXRTO Sampler Extended Real-Time Oscilloscope 9400 Series
- Optical Measuring Instruments
- oscilloscope
Granite is used, and it is a high-precision product compliant with JIS B 7513, achieved through machine cutting and hand lapping finishing.
- Other optical parts
- Optical Experimental Parts
- Optical Measuring Instruments
Easy-to-read digital illuminance meter
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
Fine Tech Japan Specialized Technology Seminar "Chromaticity and Uniformity Inspection in Micro LED"
At the 28th Fine Tech Japan (LCD, Organic EL, Sensor Technology Exhibition) specialized technical seminar, I will also be giving a presentation. As μLED is becoming the mainstream device to meet the expanding display's color gamut and contrast, the uniformity of brightness and chromaticity has become an issue due to the intensification of self-emission. The world's first developed two-dimensional spectral radiance meter, SR-5000, can analyze subpixels smaller than 2um! In this presentation, I will introduce examples. ■ "Chromaticity and Uniformity Inspection in Micro LED" Presentation December 7 (Friday) 9:30–10:20 Optical Measurement Department Sales Group Manager Kazuto Nishikawa We sincerely look forward to your attendance!
High-speed measurement of brightness in about 1 second! It is possible to detect flicker light with a small S/N ratio of approximately 0.04 cd/m² brightness difference!
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
Introduction of a high-precision illuminance meter for illuminance management and a highly sensitive, wide-range ultraviolet intensity meter with excellent operability.
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
- Lamps and light emitting devices
For vehicle-mounted rearview cameras and surveillance cameras. Ideal for measuring near-ultraviolet lighting!!
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
- Spectroscopic Analysis Equipment
The ideal wide-range illuminance meter for evaluating and managing next-generation lighting!
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
Introduction to Camera Monitor System (CMS) Evaluation Corresponding Measuring Instruments
- Optical Measuring Instruments
Approximately 17 seconds of spectral high-speed measurement at 0.005 cd/m², ultra-low brightness spectroradiometer.
- Optical Measuring Instruments
- Image Processing Equipment
Measurement support for 0.1 cd/m² and above. Suitable for measuring CCFL and LED backlight units. Ideal for measuring light source lamps!
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
Achieving high precision in ultra-weak near-infrared measurements!
- Optical Measuring Instruments
- Other measurement, recording and measuring instruments
We provide display quality analysis in accordance with the DFF automotive OEM workgroup Black MURA standard.
- Optical Measuring Instruments
The standard next-generation model of the SR series, pursuing HDR, high speed, and operability.
- Optical Measuring Instruments