List of 3D measuring device products
- classification：3D measuring device
181～225 item / All 897 items
We provide comprehensive support from design to manufacturing and maintenance!
- Contract manufacturing
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
Modeling from 3D scan data! Streamlining toy prototyping.
- 3D measuring device
- Other CAD related software
- 3D CAD
Streamlining reverse engineering from 3D scan data.
- 3D measuring device
- Other CAD related software
- 3D CAD
The industry's first photo measurement and mapping system has arrived!
- 3D measuring device
Industrial CT data analysis and visualization software. Strongly supports internal observation.
- Analytical Equipment and Devices
- 3D measuring device
- Image analysis software
CT data analysis software that strongly supports quality control of automotive parts.
- Analytical Equipment and Devices
- 3D measuring device
- Image analysis software
High-speed display of various 2D/3D data! For simulation of machine tools.
- 3D measuring device
- Other CAD related software
- 3D CAD
In-house developed series of 3D shape inspection devices! A dimensional inspection device that accommodates high-difficulty work such as metallic luster and cylindrical shapes without contact.
- 3D measuring device
Creating drawings of things that are not on the drawings! Realizing 'reverse engineering' with a 3D scanner measuring device.
- 3D CAD
- 3D measuring device
Automated pallet measurement system to support efficient loading into containers.
- 3D measuring device
Streamlining cargo inspection with high-speed measurement.
- 3D measuring device
Automated pallet dimension measurement system to improve return and storage efficiency.
- 3D measuring device
Speeding up the measurement, weighing, and barcode scanning of pallets.
- 3D measuring device
Accelerate, streamline, and accurately identify chemical product containers.
- 3D measuring device
![[Agricultural] TLD870 Pallet Dimens...](https://image.mono.ipros.com/public/product/image/212619/IPROS9318741464267879236.png?w=280&h=280){kind=small}
Automated pallet measurement system to support efficient management of harvested products.
- 3D measuring device
Improving storage efficiency in warehouses through high-speed measurement.
- 3D measuring device
Improving shipping and receiving efficiency and achieving cost reduction through high-speed measurement.
- 3D measuring device
A pallet measurement solution to enhance the traceability of pharmaceuticals.
- 3D measuring device
Automated pallet dimension measurement system to streamline food quality management.
- 3D measuring device
High-speed and efficient measurement, weighing, and barcode reading of pallets.
- 3D measuring device
Achieving tracking and efficiency of pallets through high-speed measurement.
- 3D measuring device
Visualize the anilox and protect print quality with numbers.
- 3D measuring device
![[For Research Institutions] Real Na...](https://image.mono.ipros.com/public/product/image/248027/IPROS577054615448303967.jpg?w=280&h=280){kind=small}
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enables nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Enabling nanoscale "actual measurements" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical methods enable the measurement of nanoscale fine structures.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale measurements with optical methods. For evaluating reflection characteristics.
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Measured nanoscale shape accuracy using optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Optical "vertical focus" enables nanoscale "actual measurement."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
Achieving nanoscale "actual measurement" with optical "vertical focus."
- Testing Equipment and Devices
- 3D measuring device
- Optical Measuring Instruments
3D modeling and drafting of products without drawings (e.g., manufacturing drawings for discontinued parts)
- 3D measuring device
- 3D CAD
Large workpieces can also be measured with high precision without contact!
- 3D measuring device
Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.
- 3D measuring device
2026 OPIE Exhibition Information
We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.
Capable of measuring the total thickness of 12-inch wafers. High-speed measurement without the influence of vibrations, without a scanning stage. Suitable for online, offline, and wafer inspection app...
- Coating thickness gauge
- 3D measuring device
2026 OPIE Exhibition Information
We will be exhibiting at OPIE 26' held at Pacifico Yokohama from April 22 to 24. Our booth will be L-37 (Light and Imaging Sensor & Imaging EXPO). We plan to showcase the 3D line sensor CLS2, a single-point thickness sensor, a distance sensor, and Enovasense, which can measure the thickness of opaque objects.