List of Inspection Equipment and Devices products
- classification：Inspection Equipment and Devices
3826～3840 item / All 8210 items
High-performance and simple strip machine.
- Other processing machines
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
It is possible to automatically detect and visualize even the smallest changes at the nanoscale without missing them!
- Visual Inspection Equipment
We enable difficult appearance inspections that are hard to detect with general-purpose image processing devices through high-performance image processing based on PC (HALCON or HALCON DL).
- Visual Inspection Equipment
- Contract manufacturing
Foreign objects (ceramics, stones) in the carrot will be automatically removed using vision tracking. Image processing is equipped with HALCON DL (deep learning)!
- Automatic sorting machine
- Other inspection equipment and devices
- Glass
This is a simple fixture for confirming the lighting and measuring various sample elements.
- Other inspection equipment and devices
![[Document] TCS1-/TCS2- Calibration ...](https://image.mono.ipros.com/public/product/image/b82/2000878048/IPROS48784072824046124645.png?w=280&h=280){kind=small}
±0.3% high precision load pad equipped! Custom calibration kit can be manufactured.
- Circuit Board Inspection Equipment
Selectable probe pitch from 50 to 1,000 µm! Probe mark size (width) is 30 µm or less.
- probe
Small probe scar! The reflection loss (GSG-150um pitch typ.) is -10.0dB.
- probe
Selectable probe pitch from 50 to 1,000 µm! The contact resistance (to gold pads) is 0.05 ohms.
- probe
Probe repair and tip chip replacement available! Contact resistance (to gold pad) is 0.05 ohm.
- probe
Small probe scar! The reflection loss (GSG-150um pitch typ.) is -10.0dB.
- probe
Supports up to 10 ports! Flexible probing performance with cantilever structure.
- probe
Selectable probe pitch from 50 to 1,000 µm! Probe mark size (width) is 30 µm or less.
- probe
Probe repair and tip replacement possible! Rated voltage 100V, rated current 1A.
- probe
Low loss, low reflection air coplanar probe design! The needle material is nickel alloy.
- probe
Significantly reduce setup time due to component deterioration! We provide support from current situation analysis and issue identification to solution proposals, component supply, and effect measurem...
- Other consumables
- probe
- 3D measuring device