List of Inspection Equipment and Devices products
- classification：Inspection Equipment and Devices
5686～5700 item / All 8198 items
Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.
- air conditioning
We were able to incorporate rare metals into the components of a probe that requires complex processing! Please consider the contact with the hard terminals.
- probe
- Other electronic parts
- Inspection fixture
We respond to the need to minimize the variability in resistance values specific to contact probes as much as possible.
- probe
- Other electronic parts
- Inspection fixture
A wide lineup! Custom manufacturing available for size, tip shape, material, load, and more.
- probe
For customers in sheet products and roll-to-roll lines! We design and manufacture equipment tailored to the work size.
- Other inspection equipment and devices
Flexible high-frequency probe station! We have over 15 years of experience and achievements in the industry.
- probe
Utilizing AI and deep learning, automate appearance inspection and image inspection! Improve efficiency with the automation of visual inspections.
- Visual Inspection Equipment
Providing an image inspection AI tool that can be "internalized" by on-site personnel at the factory.
CE Corporation (Headquarters: Shibuya, Tokyo, Representative Director: Hitoshi Oishi, hereinafter referred to as CE) will launch the latest version (Ver. 2.0) of its AI visual inspection and image inspection system "WiseImaging" utilizing deep learning, which has revamped its AI learning environment and simplified the construction and setup of AI image inspection, starting December 8. The latest version of "WiseImaging" simplifies the construction and setup of complex learning judgment models as a no-code AI tool for image inspection. It has been updated to a user-friendly interface that is easy to use even for factory personnel and inspectors who are not AI engineers, allowing intuitive AI learning setup and result confirmation through a click-based UI/UX design. New features have also been added, including an "Easy Learning Mode" that allows users to easily select high-accuracy learning methods and a "Data Analysis Function" that pre-analyzes whether the prepared dataset is suitable for learning. By integrating the previous screens and functions, the total number of screens has been reduced by approximately 45%, and the screen transitions from learning to result confirmation have been reduced by about 75%.
This is an important announcement regarding our products. Both products have been discontinued, and the supply of parts and support has also ended.
- Analytical Equipment and Devices
- Other inspection equipment and devices
- Spectroscopic Analysis Equipment
Power transistor, measurement inspection, visual inspection, tape storage, tube storage.
- Other inspection equipment and devices
- Semiconductor inspection/test equipment
- Taping Machine
TO220 series device high temperature measurement inspection equipment
- Other inspection equipment and devices
- Semiconductor inspection/test equipment
- Automatic sorting machine
Small semiconductor electrical measurement inspection marking appearance inspection taping device. High-speed processing composite equipment.
- Other inspection equipment and devices
- Semiconductor inspection/test equipment
- Taping Machine
A device for laser marking on semiconductor frames. Achieves high-speed transport of frames without jamming through a unique grip transport mechanism!
- Other inspection equipment and devices
- Semiconductor inspection/test equipment
- Automatic sorting machine
SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.
- Other inspection equipment and devices
- Semiconductor inspection/test equipment
- Automatic sorting machine
Manual handler capable of high-temperature measurement inspection for chip devices, temperature up to 250℃.
- Other inspection equipment and devices
- Testing Equipment and Devices
- probe
SOP device measurement inspection equipment. Supports RF measurement! High-speed, compact equipment for SOP, SSOP, and DIP.
- Other inspection equipment and devices
- Semiconductor inspection/test equipment
- Automatic sorting machine
It is a device for simple measurement tests, measuring, marking, classifying, and storing.
- Semiconductor inspection/test equipment
- Automatic sorting machine
- Other inspection equipment and devices