List of Inspection Equipment and Devices products

  • classification:Inspection Equipment and Devices

1306~1320 item / All 8218 items

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Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

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  • air conditioning

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Sensor data can be visualized in the cloud, linked to the sensing results of edge AI!

  • Evaluation Board

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Analysis of chlorine and bromine in rubber products! Latest combustion ion chromatography technology.

  • Other inspection equipment and devices

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Semi-automating the shipping inspection of mass-produced circuit boards.

  • Circuit Board Inspection Equipment

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Standard model with 1,600x high magnification! Choose between high-resolution type or wide-field type.

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  • X-ray inspection equipment

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Ultra-high magnification (2000x) and nano-order size (250/800nm) achieved in an ultra-high resolution model!

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  • X-ray inspection equipment

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Standalone board for evaluating HOLT's MIL-STD-1553 protocol IC.

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  • Evaluation Board

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Exhibits excellent functionality even in harsh environments! This is a vision system equipped with seismic and impact resistance performance.

  • Other security and surveillance systems
  • Other inspection equipment and devices

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Introducing an evaluation board that supports commissioning operations of Matter using BLE!

  • Evaluation Board

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Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.

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  • Circuit Board Inspection Equipment

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OIP.jpg

Notice of Joint Research Report and Seminar Presentation with Ehime University (JPCA Show 2024 / 2024 Microelectronics Show)

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning." We are pleased to announce that a report on this research will be displayed and introduced at the Ehime University booth during the JPCA Show 2024 / 2024 Microelectronics Show, which will be held from June 12 (Wednesday) to June 14 (Friday) at Tokyo Big Sight. Additionally, a seminar presentation related to this topic will take place on June 14 (Friday) at the venue. Takaya will also be exhibiting at the same exhibition, showcasing a real flying probe tester. We hope that all attendees will visit the booth and seminar venue. *Ehime University Booth Booth Number: 3B-56 (Academic Plaza) *Seminar Date and Time: June 14 (Friday) 13:20-13:40 Venue: Seminar Room E Session: 3DMID Seminar / Academic Plaza *Takaya Corporation Booth Booth Number: 4C-38 (Hall 4 East)

A highly versatile real-time terahertz imaging system, suitable for high-resolution applications.

  • Other inspection equipment and devices

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The MultiHarp 150 is a multi-channel event timer and time-correlated single photon counting device (TCSPC module).

  • Other inspection equipment and devices

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It is a simple inspection tool that enables 3D sub-terahertz NDT non-destructive testing sensing and imaging.

  • Other inspection equipment and devices

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A compact and high-performance flight time mass spectrometer. It can monitor gas composition in real-time with high resolution and high sensitivity.

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  • Other inspection equipment and devices

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FMCW (Frequency Modulated Continuous Wave) radar transceivers are sub-THz devices. They are suitable for non-contact and non-destructive testing, as well as 3D imaging.

  • Other inspection equipment and devices

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