List of Tester products
- classification：Tester
1～15 item / All 123 items
Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!
- Other conveying machines
Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!
- Cooling system
April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024
Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.
Efficiently improving the common signal removal ratio of the EEG and system noise testing.
- Tester
Leakage Current Circuit Breaker 【LCB 15mA 100V 15A PSC AAM A】
- Tester
Easy expansion of the tester itself! Strong support for mass production of high-density multi-pin devices.
- Tester
- Other semiconductors
Designed for the removal ratio of common mode signals in EEG and system noise testing!
- Tester
Intensive shock tests at 15-second intervals due to enhanced resistance improve productivity!
- Tester
Suitable for the development of reflective PPG products! Outputs analog signals of R and IR.
- Tester
Designed for system verification and evaluation of software algorithms!
- Tester
A tester suitable for the development of finger clip oximeters and patient monitors!
- Tester
An electrocardiogram simulator designed for performance testing!
- simulator
- Tester
We have combined accuracy, convenience, and test automation into one!
- Tester
IC multi-function inspection support! Equipped with an LCR meter developed in-house.
- Tester
Compatible with flat cables! Equipped with automatic mechanisms, manual mechanisms, and desktop mechanisms, etc.
- Tester
Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.
- Tester
Achieved over 50% higher throughput compared to conventional serial testers by adopting Per-Pin architecture!
- Tester
Yonata Electronics Co., Ltd. Announcement of Exhibition at OPIE '26
Yonata Electronics Co., Ltd. will exhibit at "OPIE '26," which will be held at Pacifico Yokohama from April 22 (Wednesday) to April 24 (Friday), 2026. We will showcase various test solutions for optical communication, silicon photonics, and semiconductors, including a live demo of the PXIe/benchtop SMU, a 1.6T compatible DCA/BERT, LD testing, CPO, PCIe high-speed cable BER, WAT/WLR, and more. We sincerely look forward to your visit. 【Highlights】 - Live demo of the 1.6T optical transceiver evaluation solution - First public unveiling of the PCIe high-speed cable BER tester - Live demo of the high-precision SMU - Display of CPO solutions and LD evaluation proposals for AI data centers 【Exhibition Information】 ■ Venue: Pacifico Yokohama ■ Date: April 22 (Wednesday) to April 24 (Friday), 2026 ■ Address: 1-1-1 Minatomirai, Nishi-ku, Yokohama, Kanagawa 220-0012 ■ Booth: K-14 For more details, please refer to: https://www.opie.jp/2026/list/info.php?id=5296&ex=