List of Tester products

  • classification:Tester

31~45 item / All 123 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

One unit compatible with LIV·EA·spectrum — fully automatic, ultra-high efficiency tester, essential for mass production.

  • Tester

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A smart test system optimized for mass production screening of silicon photonics.

  • Tester

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Overwhelming mass production capability at 4000 UPH. Automatic for dynamic, static, and high-temperature conditions.

  • Tester

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Compatible with SFP112/QSFP112! Can be mounted in the compact FTB-1 HPDC chassis.

  • ネットワークテスター『FTBx-8848x』シリーズ2.png
  • Tester

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Customize the optical integrated circuit you want to measure! Introducing our testing solutions.

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  • Tester

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Starting the 800GbE point-to-point test, also supporting breakout tests with 2x400GbE and 8x100GbE!

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  • 800GbEネットワークテスター『FTBx-8880x』シリーズ4.png
  • Tester

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A modular measurement platform for testing optical passive components 24 hours a day, 365 days a year!

  • 光コンポーネントテスタ『CTP10』2.png
  • Tester

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Full support for testing transmission standards of 800G/400G/200G/100G!

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  • ビットエラーレートテスター『BA-4000』5.png
  • ビットエラーレートテスター『BA-4000』6.png
  • Tester

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Introduction to Theoretical Analysis of Wire Probe Wear

  • probe
  • Tester
  • Semiconductor inspection/test equipment

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The layout and operability of the NS series remain unchanged, achieving stable low-temperature measurements.

  • Tester
  • Other semiconductor manufacturing equipment

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Changing the common sense of testing. AMB5600, an innovative platform that supports diverse ICs.

  • Tester
  • Testing Equipment and Devices

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Supports up to 4096 channels, a multi-site open short tester that achieves the fastest test time in the industry.

  • Tester
  • Testing Equipment and Devices

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High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.

  • Semiconductor inspection/test equipment
  • Tester

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High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.

  • Tester
  • Circuit Board Inspection Equipment

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Middle Range Model: A handler that thoroughly pursues excellent stability and significant reduction in work time.

  • Tester
  • Circuit Board Inspection Equipment

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