List of Semiconductor inspection/test equipment products
- classification：Semiconductor inspection/test equipment
271～285 item / All 752 items
It won't break even after 1 million repetitions! A mat switch with reliable operation, high durability, and low price. Suitable for options in machine tools as well. Please consult us about delivery t...
- Sensors
We can accommodate high resistance over 10,000 ohms, with diameters ranging from approximately 30 mm to 8 inches, and we also offer thinning and chip processing arrangements!
- Other semiconductors
- Processing Contract
- Wafer
Supports thin products with a minimum size of 0.4×0.2mm and a thickness of 0.1mm or less.
- Semiconductor inspection/test equipment
Test, 6-sided appearance inspection, laser marking, taping integrated machine.
- Semiconductor inspection/test equipment
A high-purity gas pressure transmitter has been released from Value Impact's in-house brand "PressVac."
- Semiconductor inspection/test equipment
High-performance SoC/Analog test system enables excellent multimedia audio/video chip testing.
- Semiconductor inspection/test equipment
Ultra-low temperature (-70℃) compatible handler, SLT compatible.
- Semiconductor inspection/test equipment
Temperature control unit with free combination of handlers.
- Semiconductor inspection/test equipment
Femtosecond fiber laser for two-photon lithography and semiconductor inspection.
- Semiconductor inspection/test equipment
![[Case Study] Semiconductor Bar Inse...](https://image.mono.ipros.com/public/product/image/99f/2000729396/IPROS82972656826360081802.png?w=280&h=280){kind=small}
Achieving a fixture that is difficult to oscillate! Full automation is possible from test condition setup, power-on testing, to data acquisition.
- Semiconductor inspection/test equipment
- Thermostatic chamber
[Case Study] Semiconductor Bar-In Equipment (RF/DC)
Achieving fixtures that are difficult to oscillate! Full automation is possible from test condition setting, current testing, to data acquisition. Our company has a long history of delivering high-frequency power FET current testing equipment to major semiconductor manufacturers in Japan. We provide custom solutions tailored to various functions based on customer applications, such as reliability testing for newly developed devices and use in production lines. Additionally, we leverage our expertise as a manufacturer of high-frequency components to design fixtures that accommodate increasingly smaller and more complex device packages, offering customized designs that consider high-frequency characteristics and long-term maintenance according to customer requests. 【Case Overview】 ■ Installation Site: FA (Semiconductor Testing Equipment) ■ Installed Product: Semiconductor Burn-In Equipment (RF/DC) *For more details, please refer to the related links or feel free to contact us.
Applying our technology and global technologies! Contributing to the development of new products and improving productivity for our customers.
- Testing Equipment and Devices
- Visual Inspection Equipment
- Semiconductor inspection/test equipment
Achieving probing compatible with multiple simultaneous measurements! Correcting misalignment after dicing.
- probe
- Semiconductor inspection/test equipment
High current/high voltage probing is possible! Achieving contact on both sides of the wafer.
- probe
- Semiconductor inspection/test equipment
This is a high-precision SC-cut OCXO in a 7×5mm size. It is a high stability, fixed frequency type with ±20ppb (-40 to +85℃). It is a standard stock item.
- Semiconductor inspection/test equipment
- Power Monitoring Equipment
- Time-frequency measurements
This is a high-precision SC-cut OCXO in a 14×9mm size. It has a high stability fixed frequency of ±10ppb (-40 to +85℃). It is a standard stock item.
- Semiconductor inspection/test equipment
- Other semiconductor manufacturing equipment
- Other electronic parts