Dual-Sided Contact Prober 'PCP-102WS'

High current/high voltage probing is possible! Achieving contact on both sides of the wafer.

The "PCP-102WS" is a high-precision prober designed for contact on both sides of a wafer (double-sided). By adopting our unique XY position correction function and profiling function, effective position correction against wafer warpage is possible. By performing Kelvin connections on the drain side of the wafer's backside and aligning the drain sense position with the source sense position on the wafer's front side, accurate RDS (on) measurements can be achieved. 【Features】 ■ Probing of high current/high voltage is possible due to the wafer clamp method using ceramic blades. ■ Probing at multiple points within a single chip is possible. ■ A high-rigidity housing made of iron base and welded frame is adopted to achieve low vibration. ■ Low cost, high throughput. ■ Compact footprint and energy-saving design. *For more details, please refer to the PDF materials or feel free to contact us.

Semiconductor inspection/test equipmentprobe