List of Semiconductor inspection/test equipment products

  • classification:Semiconductor inspection/test equipment

346~360 item / All 738 items

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Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

  • PRエリア.png
  • Other conveying machines

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Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

  • Cooling system

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April 10, 2024 (Wednesday) to April 12, 2024 (Friday) Notice of Participation in Nagoya Manufacturing World 2024

Sanwa Shiki Ventilator Co., Ltd. will be exhibiting at the 2024 Monozukuri World (Nagoya) held at Port Messe Nagoya. We will also be showcasing our large cooling fans and cool/warm ambient products. Date: April 10, 2024 - April 12, 2024 Opening: 10:00 AM Location: Nagoya Port Messe (Exhibition Hall 1) *Our booth: 19-1 We would be grateful if you could visit us if you have the time.

SUS long hole processing / stainless steel cutting

  • Semiconductor inspection/test equipment

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Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment
  • Tester

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Exhibited at SEMICON Japan 2021 Hybrid.

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

We specialize in processing sizes from 500 to 1200 mm and can guarantee precision in the 1000s range. Please feel free to consult with us first.

  • Stepper
  • Sputtering Equipment
  • Semiconductor inspection/test equipment

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Semiconductors, dies, package sorters. This is a device that performs visual inspection after extracting from tubes, trays, and taping/reels, and then repackages them.

  • Binding/Packing Machine
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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Exhibited at SEMICON Japan 2021 Hybrid.

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

Cost-reduction model of Prestige II developed specifically for 8-inch wafers. It is capable of simultaneously inspecting defects and irregularities on the wafer.

  • Visual Inspection Equipment
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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Exhibited at SEMICON Japan 2021 Hybrid.

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

The CS series is a handler for memory, designed for Pick & Place type substrates.

  • Other conveying machines
  • Semiconductor inspection/test equipment
  • Substrate transport device (loader/unloader)

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Exhibited at SEMICON Japan 2021 Hybrid.

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.

  • Semiconductor inspection/test equipment
  • Tester
  • Other semiconductor manufacturing equipment

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Exhibited at SEMICON Japan 2021 Hybrid.

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

Non-destructive/non-contact! Detection and monitoring of expansion defects inside wafers at the nm scale is possible.

  • Semiconductor inspection/test equipment
  • Other inspection equipment and devices

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A device that transports parts to semiconductor inspection equipment. It is a gravity-based transport device. It is capable of performing transport and appearance inspection simultaneously.

  • Tester
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

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ProductSmall51677.jpg

Exhibited at SEMICON Japan 2021 Hybrid.

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid," which will be held at Tokyo Big Sight from December 15 (Wednesday) to December 17 (Friday), 2021. We are a semiconductor inspection equipment manufacturer headquartered in China. The company was established in 2008 in China, and we began full-scale sales activities in Japan in October 2020. This will be our first exhibition at SEMICON Japan. We look forward to your visit.

Power transistor, measurement inspection, visual inspection, tape storage, tube storage.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Taping Machine

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TO220 series device high temperature measurement inspection equipment

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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Small semiconductor electrical measurement inspection marking appearance inspection taping device. High-speed processing composite equipment.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Taping Machine

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A device for laser marking on semiconductor frames. Achieves high-speed transport of frames without jamming through a unique grip transport mechanism!

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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SOP device measurement inspection equipment. Supports RF measurement! High-speed, compact equipment for SOP, SSOP, and DIP.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine

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