List of Semiconductor inspection/test equipment products

Reduce the workload from handling heavy objects! Here are five case studies that solved customer challenges! We are also accepting free consultations and tests tailored to your work!

• Other conveying machines

Strong cold wind from room temperature to -13°C! Depending on the usage environment, you can choose between the combo type or the separate type!

• Cooling system

Thin-film solar cell panel measurement device

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Crystal Defect Measurement Device (Light Scattering Tomography)

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Inline wafer measurement module

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Using the JPV method, non-contact measurement of junction leakage in PN junctions, evaluation of the depletion layer capacitance, and rapid measurement of the sheet resistance of PN junction samples!

• Other inspection equipment and devices
• Semiconductor inspection/test equipment

The world's only spectroscopic ellipsometer technology for measuring pore rate and pore distribution using an EP (optical porosimeter).

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

The PN determination of silicon wafers/blocks can be performed instantly.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Instantly measure the resistance of silicon ingots/blocks non-contact and non-destructively using eddy current technology.

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices

Mapping measurements using the u-PCD method are possible, and there are numerous achievements in the solar cell and semiconductor markets.

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Lifetime measurement device for single crystal silicon blocks

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Roll-to-roll spectral ellipsometer

• Semiconductor inspection/test equipment
• Distance measuring device
• Spectroscopic Analysis Equipment

Crystal defect analysis device (non-contact, non-destructive)

• Semiconductor inspection/test equipment
• Other measurement, recording and measuring instruments
• Analytical Equipment and Devices

Industry-specific catalog of a Taiwanese comprehensive electronic measuring instrument manufacturer with a 25% share of the global market!

• Semiconductor inspection/test equipment
• Power Supplies

CD-SEM for photomasks capable of high-speed and high-precision measurement of nano-patterns.

• Semiconductor inspection/test equipment
• Other machine elements

A clear explanation of case studies related to semiconductor testing, divided into four sections: background, issues, implementation, and results!

• Other semiconductors
• Semiconductor inspection/test equipment
• Other semiconductor manufacturing equipment

Before overhaul, after overhaul

• Other conveying machines
• Other inspection equipment and devices
• Semiconductor inspection/test equipment